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WS7808QD データシート(PDF) 5 Page - Will Semiconductor Ltd. |
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WS7808QD データシート(HTML) 5 Page - Will Semiconductor Ltd. |
5 / 14 page WS7808QD Will Semiconductor Ltd. 5 Oct. 2017_V1.0 IMD2 Test Conditions Nominal test condition unless otherwise stated. All unused ports are 50Ω terminated. VDD=2.8V, Temp=+25°C, PIN=0dBm. Band Transmit Frequency (MHz) Transmit Power (dBm) Frequency Blocker, Low (MHz) Frequency Blocker, High (MHz) Power Blocker (dBm) Receive Frequency (MHz) 1 1950.0 +20 190 4090 -15 2140.0 2 1880.0 80 3840 1960.0 4 1732.0 400 3864 2132.0 5 836.5 45 1718 881.5 7 2535.0 120 5187 2655.0 8 897.0 45 1839 942.0 IMD3 Test Conditions Nominal test condition unless otherwise stated. All unused ports are 50Ω terminated. VDD=2.8V, Temp=+25°C, PIN=0dBm. Band Transmit Frequency (MHz) Transmit Power (dBm) Frequency Blocker, (MHz) Power Blocker (dBm) Receive Frequency (MHz) 1 1950.0 +20 1760.0 -15 2140.0 2 1880.0 1800.0 1960.0 4 1732.0 1332.0 2132.0 5 836.5 791.5 881.5 7 2535.0 2415.0 2655.0 8 897.0 852.0 942.0 Triple Beat Ratio Test Conditions Band Transmit Frequency 1 (MHz) Transmit Power 1 (dBm) Transmit Frequency 2 (MHz) Transmit Power 2 (dBm) Frequency Blocker @ ANT (MHz) Power Blocker (dBm) TBR Product Frequency (MHz) 2 1880.0 +21.5 1881.0 +21.5 1960.0 -30 1960.0±1 5 836.5 881.5 881.5 881.5±1 |
同様の部品番号 - WS7808QD |
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同様の説明 - WS7808QD |
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