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0201A0R5A6R3CT データシート(PDF) 16 Page - WALSIN TECHNOLOGY CORPORATION |
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0201A0R5A6R3CT データシート(HTML) 16 Page - WALSIN TECHNOLOGY CORPORATION |
16 / 22 page Multilayer Ceramic Capacitors Approval Sheet Page 16 of 22 ASC_General Purpose_001AE_AS May. 2019 No. Item Test Condition Requirements 6. Temperature Coefficient With no electrical load. T.C. Operating Temp NPO -55~125°C at 25°C X7R -55~125°C at 25°C X7S -55 ~ 125°C at 25°C X5R -55~ 85°C at 25°C X6S -55~105°C at 25°C Y5V -25~ 85°C at 20°C *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at room temp. * Measurement voltage for Class II: 01005 0201 Cap ≤0.01µF: 0.5V Cap<0.1µF:1V Cap>0.01µF: 0.2V 0.1µF* ≤Cap<1µF: 0.2V Cap ≥1µF: 0.1V *0201X104/16V: 0.5V 0402 0603 Cap<1µF: 1V Cap<1µF: 1V Cap=1µF: 0.5V 1µF ≤Cap≤4.7µF: 0.5V 1µF<Cap<10µF: 0.2V Cap>4.7µF: 0.2V Cap ≥10µF: 0.1V 0805 1206/1210 Cap<10µF: 1V Cap ≤10µF: 1V Cap=10µF: 0.5V 10µF<Cap ≤100µF: 0.5V Cap>10µF: 0.2V Cap>100µF: 0.2V T.C. Capacitance Change NPO Within ±30ppm/°C X7R Within ±15% X7S Within ±22% X5R Within ±15% X6S Within ±22% Y5V Within +30%/-80% 7. Adhesive Strength of Termination * Pressurizing force: 2N (0201) and 5N ( ≤0603) and 10N (>0603) * Test time: 10±1 sec. * No remarkable damage or removal of the terminations. 8. Vibration Resistance * Vibration frequency: 10~55 Hz/min. * Total amplitude: 1.5mm * Test time: 6 hrs. (Two hrs each in three mutually perpendicular directions.) *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at room temp. *Cap./DF(Q) Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change and Q/D.F.: To meet initial spec. 9. Solderability * Solder temperature: 235±5°C * Dipping time: 2±0.5 sec. 95% min. coverage of all metalized area. 10. Bending Test * The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5±1 sec. *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs. * No remarkable damage. * Cap change: NP0: within ±5% or 0.5pF whichever is larger X7R, X5R, X6S, X7S: within ±12.5% Y5V: within ±30% (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.) 11. Resistance to Soldering Heat * Solder temperature: 260±5°C * Dipping time: 10±1 sec * Preheating: 120 to 150°C for 1 minute before imme rse the capacitor in a eutectic solder. *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. *Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change: NP0: within ±2.5% or 0.25pF whichever is larger X7R, X5R, X6S, X7S: within ±7.5% Y5V: within ±20% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. * 25% max. leaching on each edge. 12. Temperature Cycle * Conduct the five cycles according to the temperatures and time. Step Temp. (°C) Time (min.) 1 Min. operating temp. +0/-3 30±3 2 Room temp. 2~3 3 Max. operating temp. +3/-0 30±3 4 Room temp. 2~3 *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change: NP0: within ±2.5% or 0.25pF whichever is larger X7R, X5R, X6S, X7S: within ±7.5% Y5V: within ±20% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. |
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同様の説明 - 0201A0R5A6R3CT |
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