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01R5X100C500CT データシート(PDF) 6 Page - WALSIN TECHNOLOGY CORPORATION |
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01R5X100C500CT データシート(HTML) 6 Page - WALSIN TECHNOLOGY CORPORATION |
6 / 8 page Multilayer Ceramic Capacitors Approval Sheet Page 6 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 No. Item Test Condition Requirements 11. Resistance to Soldering Heat * Solder temperature: 260±5°C * Dipping time: 10±1 sec * Preheating: 120 to 150°C for 1 minute before imme rse the capacitor in a eutectic solder. * Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * No remarkable damage. * Cap change: NP0: within ±2.5% or ±0.25pF whichever is larger. X7R: within ±7.5% X5R: within ±15.0% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. * 25% max. leaching on each edge. 12. Temperature Cycle * Conduct the five cycles according to the temperatures and time. Step Temp. (°C) Time (min.) 1 Min. operating temp. +0/-3 30±3 2 Room temp. 2~3 3 Max. operating temp. +3/-0 30±3 4 Room temp. 2~3 * Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * No remarkable damage. * Cap change: NP0: within ±2.5% or ±0.25pF whichever is larger. X7R: within ±7.5% X5R: within ±15.0% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. 13. Humidity (Steady State) * Test temp.: 40±2°C * Humidity: 90~95% RH * Test time: 500+24/-0hrs. * Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * No remarkable damage. * Cap change: NP0: within ±5.0% or ±0.5pF whichever is larger. X7R: within ±12.5% X5R: within ±25.0% * Q/D.F. value: NP0: Cap ≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C Cap<10pF; Q ≥200+10C X7R: ≤7.5% X5R: ≤20% * I.R.: NP0, X7R: ≥1G or RxC≥50 -F whichever is smaller. X5R: RxC ≥10 -F. 14. Humidity Load (Damp Heat) * Test temp.: 40±2°C * Humidity: 90~95%RH * Test time: 500+24/-0 hrs. * To apply voltage:rated voltage. * Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * No remarkable damage. * Cap change: NP0: within ±7.5% or ±0.75pF whichever is larger. X7R: within ±15.0% X5R: within ±25.0% * Q/D.F. value: NP0: Cap ≥30pF, Q≥200; Cap<30pF; Q≥100+10/3C X7R: ≤7.5% X5R: ≤20% * I.R.: NP0, X7R: ≥500M or RxC≥25 -F whichever is smaller. X5R: RxC ≥5 -F. 15. High Temperature Load (Endurance) * Test temp.: NP0, X7R: 125±3°C X5R: 85±3°C * To apply voltage: (1) NP0, X7R : 200% of rated voltage (2) X5R: 10V : 150 % of rated voltage 6.3V : 100 % of rated voltage * Test time: 1000+24/-0 hrs. * Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. ** De-rating conditions: * No remarkable damage. * Cap change: NP0: within ±3.0% or ±0.3pF whichever is larger. X7R: within ±12.5% X5R: within ±25.0% * Q/D.F. value: NP0: Cap ≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C Cap<10pF; Q ≥200+10C X7R: ≤7.5% X5R: ≤20% * I.R.: NP0, X7R: ≥1G or RxC≥50 -F whichever is smaller. X5R: RxC ≥10 -F. |
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同様の説明 - 01R5X100C500CT |
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