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データシートサーチシステム |
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01005X0R5C500CT データシート(PDF) 5 Page - WALSIN TECHNOLOGY CORPORATION |
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01005X0R5C500CT データシート(HTML) 5 Page - WALSIN TECHNOLOGY CORPORATION |
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5 / 8 page  Multilayer Ceramic Capacitors Approval Sheet Page 5 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 9. RELIABILITY TEST CONDITIONS AND REQUIREMENTS No. Item Test Condition Requirements 1. Visual and Mechanical --- * No remarkable defect. * Dimensions to conform to individual specification sheet. 2. Capacitance Class I: NP0 Cap ≤1000pF, 0.5~5Vrms, 1MHz±10% Cap>1000pF, 1.0±0.2Vrms, 1KHz±10% Class II: , X7R & X5R( ≥10V) 1.0±0.2Vrms, 1KHz±10% Class II: , X5R( ≤6.3V) 0.5±0.2Vrms, 1kHz±10% *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp . * Shall not exceed the limits given in the detailed spec. 3. Q/ D.F. (Dissipation Factor) * NP0: Cap ≥30pF, Q≥1000; Cap<30pF, Q≥400+20C X7R: ≤5.0 % X5R: ≤10 % 4. Dielectric Strength * To apply voltage ( ≤100V) 250%. * Duration: 1 to 5 sec. * Charge and discharge current less than 50mA. * No evidence of damage or flash over during test. 5. Insulation Resistance To apply rated voltage for max. 120 sec. * NP0, X7R: ≥10G or RxC≥500 -F whichever is smaller. X5R: RxC ≥50 -F 6. Temperature Coefficient With no electrical load. T.C. Operating Temp NPO -55~125°C at 25°C X7R -55~125°C at 25°C X5R -55~ 85°C at 25°C *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at room temp. *Measurement voltage for Class II Cap ≤0.01µF: 0.5V Cap>0.01µF: 0.2V T.C. Capacitance Change NPO Within ±30ppm/°C X7R Within ±15% X5R Within ±15% 7. Adhesive Strength of Termination * Pressurizing force：1N * Test time: 10±1 sec. * No remarkable damage or removal of the terminations. 8. Vibration Resistance * Vibration frequency: 10~55 Hz/min. * Total amplitude: 1.5mm * Test time: 6 hrs. (Two hrs each in three mutually perpendicular directions.) * Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at room temp. * Cap./DF(Q) Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change and Q/D.F.: To meet initial spec. 9. Solderability * Solder temperature: 235±5°C * Dipping time: 2±0.5 sec. 95% min. coverage of all metalized area. 10. Bending Test * The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5±1 sec. * Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs. * No remarkable damage. * Cap change: NP0: within ±5.0% or ±0.5pF whichever is larger. X7R: within ±12.5% X5R: within ±25.0% (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.) |
同様の部品番号 - 01005X0R5C500CT |
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同様の説明 - 01005X0R5C500CT |
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