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GRM21BR61C474MA01 データシート(PDF) 3 Page - Murata Manufacturing Co., Ltd |
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GRM21BR61C474MA01 データシート(HTML) 3 Page - Murata Manufacturing Co., Ltd |
3 / 30 page Temperature Compensating Type High Dielectric Constant Type 10 Vibration Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3. Capacitance Within the specified initial value. Q or D.F. Within the specified initial value. Kind of Vibration : A simple harmonic motion 10Hz to 55Hz to 10Hz (1min) Total amplitude : 1.5mm This motion should be applied for a period of 2h in each 3 mutually perpendicular directions(total of 6h). 11 Substrate Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.1. Bending test Capacitance Within +/-5% or +/-0.5pF Within +/-10% Change (Whichever is larger) Pressurization method : Shown in Fig.2 Flexure : 1mm Holding Time : 5+/-1s Soldering Method : Reflow soldering 12 Solderability 95% of the terminations is to be soldered evenly and continuously. Test Method : Solder bath method Flux Solution of rojin ethanol 25(wt)% Preheat : 80℃ to 120℃ for 10s to 30s Solder : Sn-3.0Ag-0.5Cu Solder Temp. : 245+/-5℃ Immersion time : 2+/-0.5s 13 Resistance to Appearance No defects or abnormalities. <GRM03 size min.> Soldering Heat Capacitance Within +/-2.5% or +/- 0.25pF Within +/-7.5% Test Method : Solder bath method Change (Whichever is larger) Solder : Sn-3.0Ag-0.5Cu Solder Temp. : 270+/-5℃ Q or D.F. Within the specified initial value. Immersion time : 10+/-0.5s Exposure Time : 24+/-2h I.R. Within the specified initial value. Preheat : GRM31 size max.: 120℃ to 150℃ for 1 min GRM32 size : 100℃ to 120℃ for 1 min Voltage proof No defects. and 170℃ to 200℃ for 1 min · Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10°C for 1h and then let sit for 24+/-2h at room temperature, then measure. <GRM02 size only> Test Method : Reflow soldering (hot plate) Solder : Sn-3.0Ag-0.5Cu Solder Temp. : 270+/-5℃ Reflow Time : 10+/-0.5s Test Substrate : Glass epoxy PCB Exposure Time : 24+/-2h Preheat : 120℃ to 150℃ for 1 min · Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10°C for 1h and then let sit for 24+/-2h at room temperature, then measure. 14 Temperature Appearance No defects or abnormalities. Solder the capacitor on the test substrate shown in Fig.3. Sudden Change Capacitance Within +/-2.5% or+/- 0.25pF Within +/-7.5% Change (Whichever is larger) Perform the five cycles according to the four heat treatments shown in the following table. Q or D.F. Within the specified initial value. I.R. Within the specified initial value. Voltage proof No defects. Exposure Time : 24+/-2h · Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10°C for 1h and then let sit for 24+/-2h at room temperature, then measure. Test Method (Ref. Standard:JIS C 5101, IEC60384) No Item Specification Type Applied Force(N) GRM02 1 GRM03 2 GRM15/GRM18 5 GRM21/GRM31/GRM32 10 Step Temp.( C) Time (min) 1 Min.Operating Temp.+0/-3 30+/-3 2 Room Temp. 2 to 3 3 Max.Operating Temp.+3/-0 30+/-3 4 Room Temp 2 to 3 JEMCGS-0001U 3 |
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