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MC14536B データシート(PDF) 9 Page - ON Semiconductor |
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MC14536B データシート(HTML) 9 Page - ON Semiconductor |
9 / 16 page MC14536B http://onsemi.com 9 Figure 6. Power Dissipation Test Circuit and Waveform Figure 7. Switching Time Test Circuit and Waveforms VDD 0.01 µF CERAMIC 500 µF ID CL CL CL VSS PULSE GENERATOR SET RESET 8–BYPASS IN1 C INH MONO IN OSC INH C B A D OUT 1 OUT 2 DECODE OUT 20 ns 20 ns 90% 10% 50% 50% DUTY CYCLE PULSE GENERATOR SET RESET 8–BYPASS IN1 C INH MONO IN OSC INH C B A D OUT 1 OUT 2 DECODE OUT CL VSS VDD 20 ns 20 ns 50% IN1 tWL tWH 50% tPHL 90% 10% tPLH tTLH tTHL OUT FUNCTIONAL TEST SEQUENCE Test function (Figure 8) has been included for the reduction of test time required to exercise all 24 counter stages. This test function divides the counter into three 8–stage sections and 255 counts are loaded in each of the 8–stage sections in parallel. All flip–flops are now at a “1”. The counter is now returned to the normal 24–stages in series configuration. One more pulse is entered into In1 which will cause the counter to ripple from an all “1” state to an all “0” state. Figure 8. Functional Test Circuit VDD VSS PULSE GENERATOR SET RESET 8–BYPASS IN1 C INH MONO IN OSC INH C B A D OUT 1 OUT 2 DECODE OUT |
同様の部品番号 - MC14536B |
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同様の説明 - MC14536B |
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