データシートサーチシステム |
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LM1577KADJ データシート(PDF) 11 Page - National Semiconductor (TI) |
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LM1577KADJ データシート(HTML) 11 Page - National Semiconductor (TI) |
11 / 27 page LM1577-12, LM2577-12 Test Circuit LM1577-15, LM2577-15 Test Circuit LM1577-ADJ, LM2577-ADJ Test Circuit DS011468-30 L = 415-0930 (AIE) D = any manufacturer COUT = Sprague Type 673D Electrolytic 680 µF, 20V Note: Pin numbers shown are for TO-220 (T) package FIGURE 1. Circuit Used to Specify System Parameters for 12V Versions DS011468-26 L = 415-0930 (AIE) D = any manufacturer COUT = Sprague Type 673D Electrolytic 680 µF, 20V Note: Pin numbers shown are for TO-220 (T) package FIGURE 2. Circuit Used to Specify System Parameters for 15V Versions DS011468-9 L = 415-0930 (AIE) D = any manufacturer COUT = Sprague Type 673D Electrolytic 680 µF, 20V R1 = 48.7k in series with 511 Ω (1%) R2 = 5.62k (1%) Note: Pin numbers shown are for TO-220 (T) package FIGURE 3. Circuit Used to Specify System Parameters for ADJ Versions www.national.com 11 |
同様の部品番号 - LM1577KADJ |
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同様の説明 - LM1577KADJ |
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