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GS78116B-15I データシート(PDF) 5 Page - GSI Technology |
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GS78116B-15I データシート(HTML) 5 Page - GSI Technology |
5 / 11 page Rev: 1.02 9/2001 5/11 © 1999, Giga Semiconductor, Inc. For latest documentation see http://www.gsitechnology.com. GS78116B AC Test Conditions AC Characteristics Read Cycle Parameter Symbol -10 -12 -15 Unit Min Max Min Max Min Max Read cycle time tRC 10 — 12 — 15 — ns Address access time tAA — 10 — 12 — 15 ns Chip enable access time (CE) tAC — 10 — 12 — 15 ns Output enable to output valid (OE) tOE — 4 — 5 — 6 ns Output hold from address change tOH 3 — 3 — 3 — ns Chip enable to output in low Z (CE) tLZ* 3 — 3 — 3 — ns Output enable to output in low Z (OE) tOLZ* 0 — 0 — 0 — ns Chip disable to output in High Z (CE) tHZ* — 5 — 6 — 7 ns Output disable to output in High Z (OE) tOHZ* — 4 — 5 — 6 ns DQ VT = 1.4 V 50 Ω 30pF1 DQ 3.3 V Output Load 1 Output Load 2 589 Ω 434 Ω 5pF1 Notes: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted 3. Output load 2 for tLZ, tHZ, tOLZ and tOHZ. Parameter Conditions Input high level VIH = 2.4 V Input low level VIL = 0.4 V Input rise time tr = 1 V/ns Input fall time tf = 1 V/ns Input reference level 1.4 V Output reference level 1.4 V Output load Fig. 1& 2 |
同様の部品番号 - GS78116B-15I |
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同様の説明 - GS78116B-15I |
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