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74F1244 データシート(PDF) 4 Page - NXP Semiconductors |
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74F1244 データシート(HTML) 4 Page - NXP Semiconductors |
4 / 8 page Philips Semiconductors Product specification 74F1244 Octal buffer (3-State) 1989 Apr 04 4 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT IO = 3mA ±10% VCC 2.5 V VO High level output voltage VCC = MIN, VIL = MAX IOH = –3mA ±5% VCC 2.7 3.4 V VOH High-level output voltage VIL = MAX, VIH = MIN IO = 15mA ±10% VCC 2.0 V IOH = –15mA ±5% VCC 2.0 V VO Low level output voltage VCC = MIN, VIL = MAX IOL = 48mA ±10% VCC 0.38 0.55 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOL = 64mA ±5% VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –20 µA IOZH Off-state output current, High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output current3 VCC = MAX –100 –225 mA ICCH 30 40 mA ICC Supply current (total) ICCL VCC = MAX 57 75 mA ICCZ 43 58 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION Tamb = +25°C VCC = +5.0V CL = 50pF, RL = 500Ω Tamb = 0°C to +70°C VCC = +5.0V ± 10% CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX tPLH tPHL Propagation delay Ian, Ibn to Yn Waveform 1 2.5 2.0 4.0 5.0 5.5 7.0 2.5 2.0 6.0 7.5 ns ns tPZH tPZL Output Enable time to High or Low level Waveform 2 Waveform 3 3.0 3.0 6.0 6.5 7.5 8.0 3.0 3.0 8.5 8.5 ns ns tPHZ tPLZ Output Disable time to High or Low level Waveform 2 Waveform 3 2.0 2.0 4.0 4.0 5.5 5.5 2.0 2.0 6.0 6.0 ns ns |
同様の部品番号 - 74F1244 |
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同様の説明 - 74F1244 |
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