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ADM1181AARWZ-REEL データシート(PDF) 11 Page - Analog Devices |
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ADM1181AARWZ-REEL データシート(HTML) 11 Page - Analog Devices |
11 / 16 page ADM202E/ADM1181A Rev. C | Page 11 of 16 Table 4. IEC1000-4-2 Compliance Levels Level Contact Discharge Air Discharge 1 2 kV 2 kV 2 4 kV 4 kV 3 6 kV 8 kV 4 8 kV 15 kV Table 5. ADM202E/ADM1181A ESD Test Results ESD Test Method I/O Pins MIL-STD-883B ±15 kV IEC1000-4-2 Contact ±8 kV Air ±15 kV FAST TRANSIENT/BURST TESTING (IEC1000-4-4) IEC1000-4-4 (previously 801-4) covers electrical fast transient (EFT)/burst immunity. Electrical fast transients occur as a result of arcing contacts in switches and relays. The tests simulate the interference generated when, for example, a power relay disconnects an inductive load. A spark is generated due to the well-known back EMF effect. In fact, the spark consists of a burst of sparks as the relay contacts separate. The voltage appearing on the line, therefore, consists of a burst of extremely fast transient impulses. A similar effect occurs when switching on fluorescent lights. The fast transient/burst test defined in IEC1000-4-4 simulates this arcing, and its waveform is illustrated in Figure 17. It consists of a burst of 2.5 kHz to 5 kHz transients repeating at 300 ms intervals. It is specified for both power and data lines. 300ms 15ms t V 5ns 0.2/0.4ms 50ns V t Figure 21. IEC1000-4-4 Fast Transient Waveform A simplified circuit diagram of the actual EFT generator is illustrated in Figure 22. The transients are coupled onto the signal lines using an EFT coupling clamp. The clamp, which is 1 m long, completely surrounds the cable, providing maximum coupling capacitance (50 pF to 200 pF typ) between the clamp and the cable. High energy transients are capacitively coupled to the signal lines. Fast rise times (5 ns), as specified by the standard, result in very effective coupling. This test is very strenuous because high voltages are coupled onto the signal lines. The repetitive transients often cause problems where single pulses do not. Destructive latch-up can be induced due to the high energy content of the transients. Note that this stress is applied while the interface products are powered up and transmitting data. The EFT test applies hundreds of pulses with higher energy than ESD. Worst-case transient current on an I/O line can be as high as 40 A. RC RM CC HIGH VOLTAGE SOURCE L ZS CD 50 Ω OUTPUT Figure 22. IEC1000-4-4 Fast Transient Generator Test results are classified according to the following: • Classification 1: Normal performance within specifi- cation limits • Classification 2: Temporary degradation or loss of performance that is self-recoverable • Classification 3: Temporary degradation or loss of function or performance that requires operator intervention or system reset • Classification 4: Degradation or loss of function that is not recoverable due to damage The ADM202E/ADM1181A meet Classification 2 and have been tested under worst-case conditions using unshielded cables. Data transmission during the transient condition is corrupted, but can resume immediately following the EFT event without user intervention. |
同様の部品番号 - ADM1181AARWZ-REEL |
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同様の説明 - ADM1181AARWZ-REEL |
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