MC10178

http://onsemi.com

3

TEST VOLTAGE VALUES (Volts)

@ Test Temperature

–30

°C

–0.890

–1.890

–1.205

–1.500

–5.2

+25

°C

–0.810

–1.850

–1.105

–1.475

–5.2

+85

°C

–0.700

–1.825

–1.035

–1.440

–5.2

Pin

Under

TEST VOLTAGE APPLIED TO PINS LISTED BELOW

(V

)

Characteristic

Symbol

Under

Test

Gnd

Power Supply Drain Current

8

9

8

1, 16

Input Current

12

11

9

12

11

9

8

8

8

1, 16

1, 16

1, 16

*

*

8

1, 16

Output Voltage

Logic 1

14

15

9

11

8

8

1, 16

1, 16

Output Voltage

Logic 0

14

15

11

9

8

8

1, 16

1, 16

Threshold Voltage

Logic 1

3

14

15

5

11

9

8

8

8

1, 16

1, 16

1, 16

Threshold Voltage

Logic 0

3

14

15

5

11

9

8

8

8

1, 16

1, 16

1, 16

Switching Times

(50

Ω Load)

Pulse In

Pulse Out

–3.2 V

+2.0 V

Propagation Delay

Data Input

15

13

4

3

12

12

12

12

15

13

4

3

8

8

8

8

1, 16

1, 16

1, 16

1, 16

Rise Time

(20 to 80%)

t+

15

12

15

8

1, 16

Fall Time

(20 to 80%)

t–

15

12

15

8

1, 16

Set Input

Reset Input

15

15

11

9

15

15

8

8

1, 16

1, 16

Counting Frequency

15

12

15

8

1, 16

Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been

established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.

Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the

same manner.