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MC10231 データシート(PDF) 3 Page - ON Semiconductor |
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MC10231 データシート(HTML) 3 Page - ON Semiconductor |
3 / 8 page MC10231 http://onsemi.com 3 ELECTRICAL CHARACTERISTICS (continued) TEST VOLTAGE VALUES (Volts) @ Test Temperature VIHmax VILmin VIHAmin VILAmax VEE –30 °C –0.890 –1.890 –1.205 –1.500 –5.2 +25 °C –0.810 –1.850 –1.105 –1.475 –5.2 +85 °C –0.700 –1.825 –1.035 –1.440 –5.2 Pin Under TEST VOLTAGE APPLIED TO PINS LISTED BELOW (V ) Characteristic Symbol Under Test VIHmax VILmin VIHAmin VILAmax VEE (VCC) Gnd Power Supply Drain Current IE 8 8 1, 16 Input Current IinH 4 5 6 7 9 4 5 6 7 9 8 8 8 8 8 1, 16 1, 16 1, 16 1, 16 1, 16 IinL 4, 5* 6, 7, 9* * * 8 8 1, 16 1, 16 Output Voltage Logic 1 VOH 2 2 [ 5 7 8 8 1, 16 1, 16 Output Voltage Logic 0 VOL 3 3 [ 5 7 8 8 1, 16 1, 16 Threshold Voltage Logic 1 VOHA 2 2 [ 5 7 9 8 8 1, 16 1, 16 Threshold Voltage Logic 0 VOLA 3 3 [ 5 7 9 8 8 1, 16 1, 16 Switching Times (50 Ω Load) Clock Input +1.11Vdc Pulse In Pulse Out –3.2 V +2.0 V Propagation Delay t9+2– t6+2+ 2 2 7 9 6 2 2 8 8 1, 16 1, 16 Rise Time (20 to 80%) t2+ 2 7 9 2 8 1, 16 Fall Time (20 to 80%) t2– 2 9 2 8 1, 16 Set Input Propagation Delay t5+2+ t12+15+ t5+3– t12+14– 2 15 3 14 6 9 5 12 5 12 2 15 3 14 8 8 8 8 1, 16 1, 16 1, 16 1, 16 Reset Input Propagation Delay t4+2– t13+15– t4+3– t13+14+ 2 15 3 14 6 9 4 13 4 13 2 15 3 14 8 8 8 8 1, 16 1, 16 1, 16 1, 16 Setup Time tsetup 7 6, 7 2 8 1, 16 Hold Time thold 7 6, 7 2 8 1, 16 Toggle Frequency (Max) ftog 2 * * 6 2 8 1, 16 * Individually test each input applying VIH or VIL to input under test. [ Output level to be measured after a clock pulse has been applied to the CE Input (Pin 6) VIHmax VILmin Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained. Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the same manner. |
同様の部品番号 - MC10231_02 |
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同様の説明 - MC10231_02 |
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