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NBSG16M データシート(PDF) 5 Page - ON Semiconductor

部品番号 NBSG16M
部品情報  2.5 V/3.3 VMultilevel Input to CML Clock/Data Receiver/Driver/Translator Buffer
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メーカー  ONSEMI [ON Semiconductor]
ホームページ  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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Table 5. DC CHARACTERISTICS, POSITIVE CML OUTPUT VCC = 2.5 V; VEE = 0 V (Note 6)
Symbol
Characteristic
−40°C
25°C
85°C
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
ICC
Positive Power Supply Current
37
43
51
37
43
51
37
43
51
mA
VOH
Output HIGH Voltage (Note 7)
VCC
40
VCC
10
VCC
VCC
40
VCC
10
VCC
VCC
40
VCC
10
VCC
mV
VOL
Output LOW Voltage (Note 6)
VCC
400
VCC
330
VCC
400
VCC
330
VCC
400
VCC
330
mV
VIH
Input HIGH Voltage
(Single−Ended) (Note 8)
VEE +
1.275
VCC
1.0*
VCC
VEE +
1.275
VCC
1.0*
VCC
VEE+
1..275
VCC
1.0*
VCC
V
VIL
Input LOW Voltage
(Single−Ended) (Note 8)
VEE
VCC
1.4*
VIH
0.150
VEE
VCC
1.4*
VIH
0.150
VEE
VCC
1.4*
VIH
0.150
V
VBB
ECL Reference Voltage Output
1075
1170
1265
1075
1170
1265
1075
1170
1265
mV
VIHCMR
Input HIGH Voltage Common Mode
Range (Note 8)
(Differential Configuration)
1.2
2.5
1.2
2.5
1.2
2.5
V
RTIN
Internal Input Termination Resistor
45
50
55
45
50
55
45
50
55
W
RTOUT
Internal Output Termination
Resistor
45
50
55
45
50
55
45
50
55
W
IIH
Input HIGH Current (@ VIH)
60
100
60
100
60
100
mA
IIL
Input LOW Current (@ VIL)
25
50
25
50
25
50
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification
limit values are applied individually under normal operating conditions and not valid simultaneously.
6. Input and output parameters vary 1:1 with VCC. VEE can vary +0.125 V to −0.965 V.
7. All loading with 50 W to VCC.
8. VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differen-
tial input signal.
*Typicals used for testing purposes.


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