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ISL12021IVZ データシート(PDF) 3 Page - Intersil Corporation |
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ISL12021IVZ データシート(HTML) 3 Page - Intersil Corporation |
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3 / 24 page  3 FN6451.0 March 30, 2007 Absolute Maximum Ratings Thermal Information Voltage on VDD, VBAT, SCL, SDA, IRQ, FOUT and LVRST pins (respect to ground) . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 6.0V Voltage on X1 and X2 pins (respect to ground) . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 2.5V ESD Rating Human Body Model (Per MIL-STD-883 Method 3014) . . . . .>2kV Machine Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .>150V Thermal Resistance (Typical, Note 1) θJA (°C/W) 14 Ld TSSOP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . -65°C to +150°C Pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . .see link below http://www.intersil.com/pbfree/Pb-FreeReflow.asp CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. θ JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details. DC Operating Characteristics-RTC Test Conditions: VDD = +2.7 to +5.5V, Temperature = -20°C to +70°C, unless otherwise stated. SYMBOL PARAMETER CONDITIONS MIN TYP (Note 7) MAX UNITS NOTES VDD Main Power Supply 2.7 5.5 V VBAT Battery Supply Voltage 1.8 5.5 V 2 IDD1 Supply Current VDD = 5V 4.1 6.5 µA 3, 5 VDD = 3V 3.5 5.5 µA 3, 5 IDD2 Supply Current (I2C communications active) VDD = 5V 300 500 µA 3, 4 IDD3 Supply Current (Temperature Conversion Active) VDD = 5V 250 400 µA 3, 4 IBAT Battery Supply Current VBAT = 3V @ +25°C 1.0 1.6 µA 3 VBAT = 3V 1.0 2.1 µA 3 IBATLKG Battery Input Leakage VDD = 5.5V, VBAT = 1.8V 100 nA ILI Input Leakage Current on SCL 100 nA 4 ILO I/O Leakage Current on SDA 100 nA 4 VBATM Battery Level Monitor Threshold -100 +100 mV VPBM Brown Out Level Monitor Threshold -100 +100 mV VTRIP VBAT Mode Threshold 2.1 2.2 2.6 V VTRIPHYS VTRIP Hysteresis 10 30 50 mV VBATHYS VBAT Hysteresis 50 mV 9 Frequency Stability vs Temperature 2.7V ≤ VDD ≤ 3.6V, ±5 ppm 9 Frequency Stability vs Voltage 2.7V ≤ V DD ≤ 3.6V ±3 ppm 9 ATR Sensitivity per LSB BETA (3:0) = 1000 1 ppm 9 Temperature Sensor Accuracy VDD = VBAT = 3.3 V ±3 °C 9 IRQ, LVRST, FOUT VOL Output Low Voltage VDD = 5V, IOL = 3mA 0.4 V VDD = 2.7V, IOL = 1mA 0.4 V Power-Down Timing Power-Down Timing Test Conditions: VDD = +2.7 to +5.5V, Temperature = -20°C to +70°C, unless otherwise stated. SYMBOL PARAMETER CONDITIONS MIN TYP (Note 7) MAX UNITS NOTES VDD SR- VDD Negative Slew rate 10 V/ms 8 ISL12021 |
同様の部品番号 - ISL12021IVZ |
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同様の説明 - ISL12021IVZ |
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