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FSTUD16450 データシート(PDF) 8 Page - Fairchild Semiconductor |
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FSTUD16450 データシート(HTML) 8 Page - Fairchild Semiconductor |
8 / 11 page www.fairchildsemi.com 8 Undershoot Characteristic (Note 11) Note 11: This test is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient voltage undershoot event. FIGURE 1. Device Test Conditions Transient Input Voltage (VIN) Waveform AC Loading and Waveforms Note: Input driven by 50 Ω source terminated in 50Ω Note: CL includes load and stray capacitance Note: Input Frequency = 1.0 MHz, t W = 500 ns FIGURE 2. AC Test Circuit FIGURE 3. AC Waveforms Symbol Parameter Min Typ Max Units Conditions VOUTU Output Voltage During Undershoot 2.5 VOH − 0.3 V S2 = 0V, Figure 1 TBD TBD V S2 = VCC Parameter Value Units VIN see Waveform V R1 = R2 100K Ω VTRI 11.0 V VCC 5.5 V |
同様の部品番号 - FSTUD16450 |
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同様の説明 - FSTUD16450 |
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