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MC145011P データシート(PDF) 4 Page - Freescale Semiconductor, Inc |
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MC145011P データシート(HTML) 4 Page - Freescale Semiconductor, Inc |
4 / 12 page Sensors 4 Freescale Semiconductor MC145011 Table 3. AC Electrical Characteristics (Reference Timing Diagram Figure 6 and Figure 7) (TA = 25°C, VDD = 9.0 V, Component Values from Figure 8: R1 = 100.0 KΩ, C3 = 1500.0 pF, R2 = 10.0 M Ω) No. Characteristic Symbol Test Condition Min Max Unit 1 Oscillator Period(1) 1. Oscillator period T (= TR + TF) is determined by the external components R1, R2, and C3 where TR = (0.6931) R2 C3 and TF = (0.6931) R1 C3. The other timing characteristics are some multiple of the oscillator timing as shown in the table. 1/fOSC Free-Running Sawtooth Measured at Pin 12 9.5 11.5 ms 2 LED Status tLED No Local Smoke, and No Remote Smoke Illuminated 3 Remote Smoke, but No Local Smoke Illuminated 4 Local Smoke or Push button Test Extinguished 5 STROBE Pulse Width tW(STB) 9.5 11.5 ms 6 IRED Pulse Period tIRED Smoke Test 9.67 11.83 s 7 Chamber Sensitivity Test, without Local Smoke 38.9 47.1 8 Push button Test 0.302 0.370 9 IRED Pulse Width tw(IRED) 94 116 µs 10 IRED Rise Time tR — 30 µs IRED Fall Time tF — 200 11 SILVER and BRASS Modulation Period tMOD Local or Remote Smoke 297 363 ms 11, 12 SILVER and BRASS Duty Cycle tON/tMOD Local or Remote Smoke 73 77 % 13 SILVER and BRASS Chirp Pulse Period tCH Low Supply or Degraded Chamber Sensitivity 38.9 47.1 s 14 SILVER and BRASS Chirp Pulse Width tW(CH) Low Supply or Degraded Chamber Sensitivity 9.5 11.5 ms 15 Rising Edge on I/O to Smoke Alarm Response Time tRR Remote Smoke, No Local Smoke — 800 ms 16 Strobe Pulse Period tSTB Smoke Test 9.67 11.83 s 17 Chamber Sensitivity Test, without Local Smoke 38.9 47.1 18 Low Supply Test, without Local Smoke 38.9 47.1 19 Push button Test 0.302 0.370 Table 4. Pin Description Pin No. Pin Name Description 1 C1 A capacitor connected to this pin as shown in Figure 8. determines the gain of the on-chip photo amplifier during push button test and chamber sensitivity test (high gain). The capacitor value is chosen such that the alarm is tripped from background reflections in the chamber during push button test. Av ≈ 1 + (C1/10) where C1 is in pF. CAUTION: The value of the closed-loop gain should not exceed 10,000. 2 C2 A capacitor connected to this pin as shown in Figure 8. determines the gain of the on-chip photo amplifier except during push button or chamber sensitivity tests. Av ≈ 1 + (C2/10) where C2 is in pF. This gain increases about 10% during the IRED pulse, after two consecutive local smoke detections. Resistor R14 must be installed in series with C2. R14 ≈ [1/(12√C2)] - 680 where R14 is in ohms and C2 is in farads. 3 DETECT This input to the high-gain pulse amplifier is tied to the cathode of an external photodiode. The photodiode should have low capacitance and low dark leakage current. The diode must be shunted by a load resistor and is operated at zero bias. The Detect input must be ac/dc decoupled from all other signals, VDD, and VSS. Lead length and/or foil traces to this pin must be minimized, also. See Figure 9. |
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同様の説明 - MC145011P |
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