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TSA5060AT データシート(PDF) 10 Page - NXP Semiconductors

部品番号 TSA5060AT
部品情報  1.3 GHz I2C-bus controlled low phase noise frequency synthesizer
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メーカー  PHILIPS [NXP Semiconductors]
ホームページ  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

TSA5060AT データシート(HTML) 10 Page - NXP Semiconductors

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2000 Oct 24
10
Philips Semiconductors
Product specification
1.3 GHz I2C-bus controlled low phase
noise frequency synthesizer
TSA5060A
XT/COMP frequency output
It is possible to output either the crystal or the comparison
frequency at pin XT/COMP to be used in the application.
For example, to drive a second PLL synthesizer saving a
quartz crystal. To output fxtal it is necessary to set bit XCE
to logic 1 and bit XCS to logic 0, or bit XCE to logic 0 and
bit XCS to logic 1 during a test mode, while to output fcomp
it is necessary to set both bits XCE and XCS to logic 1.
If the output signal at this pin is not used it is recommended
to disable it by setting both bits XCE and XCS to logic 0.
Table 10 shows how this pin is programmed. At power-on,
the XT/COMP output is set with the fxtal signal selected.
Prescaler enable
The TSA5060A is able to work with the relationship
fcomp = step size for an input frequency up to 1.3 GHz,
covering the complete terrestrial and cable frequency
range.
If needed, the prescaler can be selected by setting bit PE
to logic 1 while it is not in use if bit PE is set to logic 0.
If it is important to reach a low phase noise on the
controlled VCO, it is recommended to set bit PE to logic 0
and not to use the prescaler allowing the comparison
frequency to be equal to the step size.
Test modes
It is possible to access the test modes by setting bit XCE
to logic 0 and bit XCS to logic 1. One specific test mode is
then selected using bits T2, T1 and T0, as described in
Table 10.
Table 10 XT/COMP and test mode selection; note 1
Notes
1. X = don’t care.
2. Status at Power-on reset.
XCE
XCS
T2
T1
T0
XT/COMP OUTPUT
TEST MODE
0
0
X
X
X
disabled
normal operation
1
0
XXX
fxtal
normal operation
1
1
XXX
fcomp
normal operation
01000
fxtal
test operation: charge pump sink;
status byte bit FL = 1
01001
fxtal
test operation: charge pump source;
status byte bit FL = 0
01010
fxtal
test operation: charge pump disabled;
status byte bit FL = 0
01011
fxtal
test operation: 1
2fDIV switched to Port P0
011
X
X
fxtal
test operation: drive voltage (pin DRIVE)
is off (high-impedance); note 2


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