データシートサーチシステム |
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SN74ABT8245DWR データシート(PDF) 2 Page - Texas Instruments |
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SN74ABT8245DWR データシート(HTML) 2 Page - Texas Instruments |
2 / 25 page SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) In the test mode, the normal operation of the SCOPE ™ bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8245 is characterized for operation over the full military temperature range of – 55 °C to 125°C. The SN74ABT8245 is characterized for operation from – 40 °C to 85°C. FUNCTION TABLE (normal mode) INPUTS OPERATION OE DIR OPERATION L L B data to A bus L H A data to B bus H X Isolation |
同様の部品番号 - SN74ABT8245DWR |
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同様の説明 - SN74ABT8245DWR |
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