データシートサーチシステム
  Japanese  ▼
ALLDATASHEET.JP

X  

SN74ABT8652DL データシート(PDF) 6 Page - Texas Instruments

Click here to check the latest version.
部品番号 SN74ABT8652DL
部品情報  SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
Download  25 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
メーカー  TI [Texas Instruments]
ホームページ  http://www.ti.com
Logo TI - Texas Instruments

SN74ABT8652DL データシート(HTML) 6 Page - Texas Instruments

Back Button SN74ABT8652DL Datasheet HTML 2Page - Texas Instruments SN74ABT8652DL Datasheet HTML 3Page - Texas Instruments SN74ABT8652DL Datasheet HTML 4Page - Texas Instruments SN74ABT8652DL Datasheet HTML 5Page - Texas Instruments SN74ABT8652DL Datasheet HTML 6Page - Texas Instruments SN74ABT8652DL Datasheet HTML 7Page - Texas Instruments SN74ABT8652DL Datasheet HTML 8Page - Texas Instruments SN74ABT8652DL Datasheet HTML 9Page - Texas Instruments SN74ABT8652DL Datasheet HTML 10Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 6 / 25 page
background image
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
test architecture
Serial-test information is conveyed by means of a 4-wire test bus or TAP, that conforms to IEEE Standard
1149.1-1990. Test instructions, test data, and test control signals all are passed along this serial-test bus. The
TAP controller monitors two signals from the test bus, TCK and TMS. The TAP controller extracts the
synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip
control signals for the test structures in the device. Figure 2 shows the TAP-controller state diagram.
The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and
output data changes on the falling edge of TCK. This scheme ensures data to be captured is valid for fully
one-half of the TCK cycle.
The functional block diagram shows the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan
architecture and the relationship among the test bus, the TAP controller, and the test registers. As shown, the
device contains an 8-bit instruction register and three test-data registers: a 38-bit boundary-scan register, an
11-bit boundary-control register, and a 1-bit bypass register.
Test-Logic-Reset
Run-Test/Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Update-DR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = L
TMS = H
TMS = L
Exit2-DR
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Update-IR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-IR
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
Figure 2. TAP-Controller State Diagram


同様の部品番号 - SN74ABT8652DL

メーカー部品番号データシート部品情報
logo
Texas Instruments
SN74ABT8652DL TI-SN74ABT8652DL Datasheet
682Kb / 33P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DL TI1-SN74ABT8652DL Datasheet
520Kb / 31P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DLG4 TI-SN74ABT8652DLG4 Datasheet
682Kb / 33P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DLG4 TI1-SN74ABT8652DLG4 Datasheet
520Kb / 31P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DLR TI-SN74ABT8652DLR Datasheet
682Kb / 33P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
More results

同様の説明 - SN74ABT8652DL

メーカー部品番号データシート部品情報
logo
Texas Instruments
SN54ABT8652 TI-SN54ABT8652_07 Datasheet
682Kb / 33P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN54ABT8652 TI1-SN54ABT8652_16 Datasheet
520Kb / 31P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN54ABT8245 TI-SN54ABT8245_07 Datasheet
635Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245A TI-SN54BCT8245A Datasheet
309Kb / 22P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245A TI-SN54BCT8245A_08 Datasheet
658Kb / 29P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_08 Datasheet
665Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245 Datasheet
364Kb / 25P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_06 Datasheet
483Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8646 TI-SN54ABT8646 Datasheet
537Kb / 32P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
74ABTH182652APMG4 TI1-74ABTH182652APMG4 Datasheet
580Kb / 39P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25


データシート ダウンロード

Go To PDF Page


リンク URL




プライバシーポリシー
ALLDATASHEET.JP
ALLDATASHEETはお客様のビジネスに役立ちますか?  [ DONATE ] 

Alldatasheetは   |   広告   |   お問い合わせ   |   プライバシーポリシー   |   リンク交換   |   メーカーリスト
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com