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MMA8104EGR2 データシート(PDF) 34 Page - Freescale Semiconductor, Inc |
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MMA8104EGR2 データシート(HTML) 34 Page - Freescale Semiconductor, Inc |
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34 / 47 page  MMA81XXEG Sensors 34 Freescale Semiconductor 5.6 ELECTRICAL CHARACTERISTICS (continued) VL ≤ (VBUS - VSS) ≤ VH, VL ≤ (VHCAP - VSS) ≤ VH,TL ≤ TA ≤ TH, unless otherwise specified. . 1. Parameters tested 100% at final test. 2. Parameters tested 100% at unit probe. 3. Verified by characterization, not tested in production. 4. (*) Indicates a customer critical characteristic or Freescale important characteristic. 7. Tested 100% at 10-bit output. 8-bit value verified via scan. Ref Characteristic Symbol Min Typ Max Units 94 95 96 97 Total Noise (see Figure 5-3) 400 Hz, 4-pole filter, 20g range RMS, 100 samples P-P, 100 samples 180 Hz, 2-pole filter, 20g range RMS, 100 samples P-P, 100 samples nRMS nP-P nRMS nP-P — — — — — — — — 2 8 2 7 digit digit digit digit (3) (3) (3) (3) 98 99 100 101 Cross-Axis Sensitivity X-axis, X-axis to Y-axis X-axis, X-axis to Z-axis Y-axis, Y-axis to X-axis Y-axis, Y-axis to Z-axis VXY VXZ VYX VYZ -5 -5 -5 -5 — — — — +5 +5 +5 +5 % % % % (3) (3) (3) (3) 102 103 104 105 106 107 Analog to digital converter Relative accuracy Differential nonlinearity Gain error Offset error (VIN = VCREG/2) Noise (RMS, 100 samples) Noise (peak) INL DNL GAINERR OFST nRMS nP-P -2 -1 -1 -3 -1 -3 — — — — — — +2 +1 +1 +3 +1 +3 digit digit %FSR digit digit digit (3) (3) (2) (3) (3) (3) 108 109 110 111 112 113 114 115 116 117 Deflection (Self-Test Output - Offset, average of 30 samples, measured in 0g orientation, TA = 25° C) X-axis, 20g Range X-axis, 40g Range X-axis, 50g Range X-axis, 100g Range X-axis, 150g Range X-axis, 250g Range Z-axis, 40g Range Z-axis, 100g Range Z-axis, 150g Range Z-axis, 250g Range * * * * * * * * * * ΔDFLCT ΔDFLCT ΔDFLCT ΔDFLCT DDFLCT DDFLCT ΔDFLCT ΔDFLCT ΔDFLCT ΔDFLCT — — — — — — — — — — 246 123 98 49 82 49 307 299 205 123 — — — — — — — — — — digit digit digit digit digit digit digit digit digit digit (7) (7) (7) (7) (7) (7) (7) (7) (7) (7) 118 Self-Test deflection range, TA = 25 °C, measured in 0g orientation ΔDFLCT -10 — +10 % (1) 119 Self-Test deflection range, TL ≤ TA ≤ TH, measured in 0g orientation ΔDFLCT -20 — +20 % (1) |
同様の部品番号 - MMA8104EGR2 |
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同様の説明 - MMA8104EGR2 |
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