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ADM1027 データシート(PDF) 3 Page - ON Semiconductor

部品番号 ADM1027
部品情報  dBCOOL??Remote Thermal Controller and Voltage Monitor
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メーカー  ONSEMI [ON Semiconductor]
ホームページ  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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REV. A
ADM1027
–3–
Parameter
Min
Typ
Max
Unit
Test Conditions/Comment
OPEN-DRAIN SERIAL DATA BUS
OUTPUT (SDA)
Output Low Voltage, VOL
0.4
V
IOUT = –4.0 mA, VCC = 3.3 V
High Level Output Current, IOH
0.1
1
mA
VOUT = VCC
SMBUS DIGITAL INPUTS
(SCL, SDA)
Input High Voltage, VIH
2.0
V
Input Low Voltage, VIL
0.4
V
Hysteresis
500
mV
DIGITAL INPUT LOGIC LEVELS
(VID0–4)
Input High Voltage, VIH
1.7
V
Input Low Voltage, VIL
0.8
V
DIGITAL INPUT LOGIC LEVELS
(TACH INPUTS)
Input High Voltage, VIH
2.0
V
5.5
V
Maximum Input Voltage
Input Low Voltage, VIL
0.8
V
–0.3
V
Minimum Input Voltage
Hysteresis
0.5
V p-p
DIGITAL INPUT CURRENT
Input High Current, IIH
–1
mA
VIN = VCC
Input Low Current, IIL
1
mA
VIN = 0
Input Capacitance, CIN
5
pF
SERIAL BUS TIMING
Clock Frequency, fSCLK
10
100
kHz
See Figure 1
Glitch Immunity, tSW
50
ns
See Figure 1
Bus Free Time, tBUF
4.7
ms
See Figure 1
Start Setup Time, tSU;STA
4.7
ms
See Figure 1
Start Hold Time, tHD;STA
4.0
ms
See Figure 1
SCL Low Time, tLOW
4.7
ms
See Figure 1
SCL High Time, tHIGH
4.0
50
ms
See Figure 1
SCL, SDA Rise Time, tr
1000
ns
See Figure 1
SCL, SDA Fall Time, tf
300
ms
See Figure 1
Data Setup Time, tSU;DAT
250
ns
See Figure 1
Data Hold Time, tHD;DAT
300
ns
See Figure 1
Detect Clock Low Timeout, tTIMEOUT
15
35
ms
Can Be Optionally Disabled
NOTES
1All voltages are measured with respect to GND, unless otherwise specified.
2Typicals are at T
A = 40
rC and represent the most likely parametric norm.
3Logic inputs will accept input high voltages up to V
MAX even when the device is operating down to V MIN.
4Timing specifications are tested at logic levels of V
IL = 0.8 V for a falling edge and VIH = 2.0 V for a rising edge.
Specifications subject to change without notice.
Rev. 3 | Page 3 of 56 | www.onsemi.com


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