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N02L6181AB28IT データシート(PDF) 6 Page - ON Semiconductor |
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N02L6181AB28IT データシート(HTML) 6 Page - ON Semiconductor |
6 / 11 page Rev. 4 | Page 6 of 11 | www.onsemi.com N02L6181A Timing Test Conditions Item Input Pulse Level 0.1VCC to 0.9 VCC Input Rise and Fall Time 5ns Input and Output Timing Reference Levels 0.5 VCC Output Load CL = 30pF Power Supply Voltage 1.65 - 2.2V Operating Temperature -40 to +85 oC Timing Item Symbol 85ns 70ns Units Min. Max. Min. Max. Read Cycle Time tRC 85 70 ns Address Access Time tAA 85 70 ns Chip Enable to Valid Output tCO 85 70 ns Output Enable to Valid Output tOE 30 25 ns Byte Select to Valid Output tLB, tUB 85 70 ns Chip Enable to Low-Z output tLZ 10 10 ns Output Enable to Low-Z Output tOLZ 55 ns Byte Select to Low-Z Output tLBZ, tUBZ 10 10 ns Chip Disable to High-Z Output tHZ 30 25 ns Output Disable to High-Z Output tOHZ 30 25 ns Byte Select Disable to High-Z Output tLBHZ, tUBHZ 30 25 ns Output Hold from Address Change tOH 55 ns Write Cycle Time tWC 85 70 ns Chip Enable to End of Write tCW 50 40 ns Address Valid to End of Write tAW 50 40 ns Byte Select to End of Write tLBW, tUBW 50 40 ns Write Pulse Width tWP 50 40 ns Address Setup Time tAS 00 ns Write Recovery Time tWR 00 ns Write to High-Z Output tWHZ 25 20 ns Data to Write Time Overlap tDW 40 40 ns Data Hold from Write Time tDH 00 ns End Write to Low-Z Output tOW 10 10 ns |
同様の部品番号 - N02L6181AB28IT |
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同様の説明 - N02L6181AB28IT |
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