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MC100ES8014 データシート(PDF) 5 Page - Integrated Device Technology |
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MC100ES8014 データシート(HTML) 5 Page - Integrated Device Technology |
5 / 7 page MC100ES8014 TIMING SOLUTIONS 5 MOTOROLA Figure 2. MC100ES8014 AC Test Reference CLKx tPDL (EN to Qx[]) 50% tPLD (EN to Qx[]) CLKx EN Qx[] Qx[] Outputs disabled Figure 3. MC100ES8014 AC Test Reference Differential Pulse Generator Z = 50 Ω RT = 50Ω ZO = 50Ω DUT MC100ES8014 VTT=GND RT = 50Ω ZO = 50Ω VTT=GND Figure 4. MC100ES8014 AC Reference Measurement Waveform (HSTL Input) CLK0,1 tPD (CLK0,1 to Q[0–4]) VX=0.75V VDIF=1.0V CLK0,1 Q[0–4] Q[0–4] tPD (CLK0,1 to Q[0–4]) VCMR=VCC–1.3V VPP=0.8V CLK0,1 CLK0,1 Q[0–4] Q[0–4] Figure 5. MC100ES8014 AC Reference Measurement Waveform (PECL Input) Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com MC100ES8014 Low Voltage 1:5 Differential LVDS Clock Fanout Buffer NETCOM IDT™ Low Voltage 1:5 Differential LVDS Clock Fanout Buffer Freescale Timing Solutions Organization has been acquired by Integrated Device Technology, Inc MC100ES8014 5 |
同様の部品番号 - MC100ES8014 |
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同様の説明 - MC100ES8014 |
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