データシートサーチシステム |
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CD4010BQDRQ1 データシート(PDF) 2 Page - Texas Instruments |
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CD4010BQDRQ1 データシート(HTML) 2 Page - Texas Instruments |
2 / 14 page CD4021B-Q1 SCHS378 – MARCH 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. Functional Diagram Logic Diagram 2 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): CD4021B-Q1 |
同様の部品番号 - CD4010BQDRQ1 |
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同様の説明 - CD4010BQDRQ1 |
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