データシートサーチシステム |
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FQD20N06 データシート(PDF) 6 Page - Fairchild Semiconductor |
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FQD20N06 データシート(HTML) 6 Page - Fairchild Semiconductor |
6 / 9 page Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT V DS + _ Driver R G Same Type as DUT VGS • dv/dt controlled by R G •I SD controlled by pulse period VDD L I SD 10V V GS ( Driver ) I SD ( DUT ) V DS ( DUT ) VDD Body Diode Forward Voltage Drop VSD I FM , Body Diode Forward Current Body Diode Reverse Current IRM Body Diode Recovery dv/dt di/dt D = Gate Pulse Width Gate Pulse Period -------------------------- DUT V DS + _ Driver R G Same Type as DUT VGS • dv/dt controlled by R G •I SD controlled by pulse period VDD L L I SD 10V V GS ( Driver ) I SD ( DUT ) V DS ( DUT ) VDD Body Diode Forward Voltage Drop VSD I FM , Body Diode Forward Current Body Diode Reverse Current IRM Body Diode Recovery dv/dt di/dt D = Gate Pulse Width Gate Pulse Period -------------------------- D = Gate Pulse Width Gate Pulse Period -------------------------- Rev. A2. January 2009 ©2009 Fairchild Semiconductor Corporation |
同様の部品番号 - FQD20N06_09 |
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同様の説明 - FQD20N06_09 |
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