SZNUP2105LT3G datasheet(5/8 Pages) ONSEMI

部品番号	SZNUP2105LT3G

部品情報	Dual Line CAN Bus Protector

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NUP2105L, SZNUP2105L

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5

EMI Specifications

The EMI protection level provided by the TVS device can

be measured using the International Organization for

Standardization (ISO) 7637−1 and −3 specifications that are

representative of various noise sources. The ISO 7637−1

specification is used to define the susceptibility to coupled

transient noise on a 12 V power supply, while ISO 7637−3

defines the noise immunity tests for data lines. The ISO 7637

tests also verify the robustness and reliability of a design by

applying the surge voltage for extended durations.

The IEC 61000−4−X specifications can also be used to

quantify the EMI immunity level of a CAN system. The IEC

61000−4 and ISO 7637 tests are similar; however, the IEC

standard was created as a generic test for any electronic

system, while the ISO 7637 standard was designed for

vehicular applications. The IEC61000−4−4 Electrical Fast

Transient (EFT) specification is similar to the ISO 7637−1

pulse 1 and 2 tests and is a requirement of SDS CAN

systems. The IEC 61000−4−5 test is used to define the power

absorption capacity of a TVS device and long duration

voltage transients such as lightning. Table 2 provides a

summary of the ISO 7637 and IEC 61000−4−X test

specifications. Table 3 provides the NUP2105L’s ESD

test results.

Table 2. ISO 7637 and IEC 61000−4−X Test Specifications

Test

Waveform

Test Specifications

NUP2105L Test

Simulated Noise Source

ISO 7637−1

12 V Power Supply Lines

Pulse 1

Vs = 0 to −100 V

Imax = 10 A

tduration = 5000 pulses

Imax = 1.75 A

Vclamp_max = 31 V

tduration = 5000 pulses

Ri = 10 W, tr = 1.0 ms,

td_10% = 2000 ms, t1 = 2.5 s,

t2 = 200 ms, t3 = 100 ms

DUT in parallel with

inductive load that is

disconnected from power

supply.

Pulse 2

Vs = 0 to +100 V

Imax = 10 A

tduration = 5000 pulses

Imax = 9.5 A

Vclamp_max = 33 V

tduration = 5000 pulses

Ri = 10 W, tr = 1.0 ms,

td_10% = 50 ms, t1 = 2.5 s,

t2 = 200 ms

DUT in series with inductor

that is disconnected.

ISO 7637−3

Data Line EFT

Pulse ‘a’

Vs = −60 V

Imax = 1.2 A

tduration = 10 minutes

Imax = 50 A

Vclamp_max = 40 V

tduration = 60 minutes

Ri = 50 W, tr = 5.0 ns,

td_10% = 0.1 ms, t1 = 100 ms,

t2 = 10 ms, t3 = 90 ms

Switching noise of inductive

loads.

Pulse ‘b’

Vs = +40 V

Imax = 0.8 A

tduration = 10 minutes

IEC 61000−4−4

Data Line EFT

Vopen circuit = 2.0 kV

Ishort circuit = 40 A

(Level 4 = Severe Industrial

Environment)

Ri = 50 W, tr < 5.0 ns,

td_50% = 50 ns, tburst = 15 ms,

fburst = 2.0 to 5.0 kHz,

trepeat = 300 ms

tduration = 1 minute

(Note 2)

Switching noise of inductive

loads.

IEC 61000−4−5

Vopen circuit = 1.2 x 50 ms,

Ishort circuit = 8 x 20 ms

Ri = 50 W

Lightning, nonrepetitive

power line and load

switching

1. DUT = device under test.

2. The EFT immunity level was measured with test limits beyond the IEC 61000−4−4 test, but with the more severe test conditions of

ISO 7637−3.

Table 3. NUP2105L ESD Test Results

ESD Specification

Test

Test Level

Pass / Fail

Human Body Model

Contact

16 kV

Pass

IEC 61000−4−2

Contact

30 kV (Note 3)

Pass

Non−contact (Air Discharge)

30 kV (Note 3)

Pass

3. Test equipment maximum test voltage is 30 kV.

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