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TS3DV642A0RUAR データシート(PDF) 4 Page - Texas Instruments

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部品番号 TS3DV642A0RUAR
部品情報  12-Channel 1:2 MUX/DEMUX with1.8V Compatible Control and Power-Down Mode
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メーカー  TI1 [Texas Instruments]
ホームページ  http://www.ti.com
Logo TI1 - Texas Instruments

TS3DV642A0RUAR データシート(HTML) 4 Page - Texas Instruments

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TS3DV642
SCDS343 – MAY 2013
www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
VCC
Supply voltage range
–0.5
5.5
V
VI/O
Analog voltage range(2)(3)(4)
All I/O
–0.5
5.5
V
VIN
Digital input voltage range(2)(3)
SEL1, SEL2,EN
–0.5
5.5
V
II/OK
Analog port diode current
VI/O < 0
–50
mA
IIK
Digital input clamp current
VIN < 0
–50
mA
II/O
On-state switch current(5)
–128
128
mA
θJA
Package thermal impedance(6)
RUA package
TBD
°C/W
Tstg
Storage temperature range
–65
150
°C
(1)
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
All voltages are with respect to ground, unless otherwise specified.
(3)
The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
(4)
VI and VO are used to denote specific conditions for VI/O.
(5)
II and IO are used to denote specific conditions for II/O.
(6)
The package thermal impedance is calculated in accordance with JESD 51-7.
RECOMMENDED OPERATING CONDITIONS
(1)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
VCC
Supply voltage
2.6
4.5
V
VI/O
Input/Output voltage
0
5.5
V
TA
Operating free-air temperature
–40
85
°C
(1)
All unused control inputs of the device must be held at VDD or GND to ensure proper device operation. Refer to the TI application
report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
ELECTRICAL CHARACTERISTICS
PARAMETER
TEST CONDITIONS(1)
MIN TYP(2)
MAX
UNIT
PORT A
D0 to D3
6.5
9.5
Ω
VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
RON
ON-state resistance
II/O = –40 mA
SCL, SDA, HPE, CEC
6
9.5
Ω
VCC = 3 V, VI/O = 1.5 V and VCC,
ON-state resistance
RON(flat)
(3)
All I/O
1.5
Ω
flatness
II/O = –40 mA
On-state resistance
VCC = 3 V, 1.5 V
≤ VI/O ≤ VCC,
ΔRON
(4)
match between high-
D0 to D3
0.4
1
Ω
II/O = –40 mA
speed channels
VCC = 0 V, VI/O = 0 to 3.6 V,
IOFF
Leakage under power off All outputs
±10
µA
VIN = 0 V to 5.5 V
PORT B
D0 to D3
8.2
10.5
Ω
VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
RON
ON-state resistance
II/O = -40 mA
SCL, SDA, HPE, CEC
6
10.5
Ω
VCC = 3 V, VI/O = 1.5 V and VCC,
ON-state resistance
RON(flat)
(3)
All I/O
1.5
Ω
flatness
II/O = –40 mA
On-state resistance
VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
ΔRON
(4)
match between high-
D0 to D3
0.4
1
Ω
II/O = –40 mA
speed channels
VCC = 0 V, VI/O = 0 V to 3.6 V,
IOFF
Leakage under power off All outputs
±10
µA
VIN = V to 5.5 V
(1)
VI, VO, II, and IO refer to I/O pins, VIN refers to the control inputs
(2)
All typical values are at VCC = 3.3V (unless otherwise noted), TA = 25°C
(3)
RON(FLAT) is the difference of RON in a given channel at specified voltages.
(4)
ΔRON is the difference of RON from center port to any other ports.
4
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