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OP-16CH883 データシート(PDF) 10 Page - List of Unclassifed Manufacturers

部品番号 OP-16CH883
部品情報  MICROCIRCUIT, LINEAR, JFET-INPUT, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
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OP-16CH883 データシート(HTML) 10 Page - List of Unclassifed Manufacturers

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STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-89543
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
10
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Test requirements
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class M
Device
class Q
Device
class V
Interim electrical
parameters (see 4.2)
1
1
1
Final electrical
parameters (see 4.2)
1,2,3,4,5,6,8a 1/
1,2,3,4,5,6, 1/
8A
1,2,3,4,5,6 1/
8A
Group A test
requirements (see 4.4)
1,2,3,4,5,6,7,8A, 2/
9,10
1,2,3,4,5,6, 2/
7,8A,9,10
1,2,3,4,5,6, 2/
7,8A,9,10
Group C end-point electrical
parameters (see 4.4)
1,4
1,4
1,4 3/
Group D end-point electrical
parameters (see 4.4)
1,4
1,4
1,4
Group E end-point electrical
parameters (see 4.4)
1,4
1,4
1,4
1/ PDA applies to subgroup 1. VOS, IOS, and deltas excluded from PDA.
2/ Subgroup 10, if not tested, shall be guaranteed to the limits specified in table I herein.
3/ Delta limits as specified in table IIB shall be required where specified, and delta limits shall be
computed with reference to the previous endpoint electrical parameters.
TABLE IIB. Delta limits at +25
°C.
Test
Device type
Delta limits
Min
Max
VOS
04
±0.5 mV
IIB
±45 pA
IOS
±20 pA
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a.
Tests shall be as specified in table IIA herein.
b.
Subgroups 8B and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.


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