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AM27C4096-95DE データシート(PDF) 9 Page - Advanced Micro Devices |
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AM27C4096-95DE データシート(HTML) 9 Page - Advanced Micro Devices |
9 / 12 page Am27C4096 9 TEST CONDITIONS Table 1. Test Specifications SWITCHING TEST WAVEFORM KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 5.0 V Device Under Test 11408F-7 Figure 3. Test Setup Note: Diodes are IN3064 or equivalents. Test Condition All Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 100 pF Input Rise and Fall Times ≤ 20 ns Input Pulse Levels 0.45–2.4 V Input timing measurement reference levels 0.8, 2.0 V Output timing measurement reference levels 0.8, 2.0 V 2.4 V 0.45 V Input Output Test Points 2.0 V 2.0 V 0.8 V 0.8 V 11408F-8 Note: For CL = 100 pF. KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) |
同様の部品番号 - AM27C4096-95DE |
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同様の説明 - AM27C4096-95DE |
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