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BCP54 データシート(PDF) 10 Page - EPCOS

部品番号 BCP54
部品情報  45 V, 1 A NPN medium power transistors
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18
04/00
The following table shows the most important standards in the field of immunity to interference.
The IEC 1000 or EN 61000 series of standards are planned as central EMC standards into which
all EMC regulations (e.g. IEC 801, IEC 555) are to be integrated in the next few years.
2.5
Propagation of conducted interference
In order to be able to choose suitable interference suppression components, the way in which con-
ducted interference is propagated needs to be known (fig. 8).
Fig. 8
Common-mode and differential-mode interference
Standard
Test characteristics
Phenomena
Conducted interference
EN 61000-4-4
IEC 61000-4-4
5/50 ns (single impulse)
15 kHz burst
Burst
Cause: switching processes
EN 61000-4-5
IEC 61000-4-5
1,2 / 50 ms (open-circuit voltage)
8 / 20 ms (short-circuit current)
Surge (high-energy transients)
Cause: lightning strikes mains
lines, switching processes
EN 61000-4-6 (ENV 50141)
IEC 801-6
1 V, 3 V, 10 V
150 kHz … 80 MHz
High-frequency coupling
Narrow-band interference
Radiated interference
EN 61000-4-3 (ENV 50140)
IEC 801-3
3 V/m, 10 V/m
80 … 1000 MHz
High-frequency
interference fields
Electrostatic discharge (ESD)
EN 61000-4-2
IEC 61000-4-2
Up to 8 kV
5 / 50 ns
Electrostatic discharge
Voltage dips, short interruptions and variations
EN 61000-4-11
IEC 61000-4-11
0,4
VR
1 … 50 ms
0,7
VR
optional
VR = 0
10 ms
Electrostatic discharge
Cp: Parasitic capacitance
R: Resistance
Common-mode
interference current
Differential-mode
interference current
Interference
source
Disturbed
equipment
General Technical Information


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