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IRF22N60 データシート(PDF) 6 Page - Nell Semiconductor Co., Ltd |
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IRF22N60 データシート(HTML) 6 Page - Nell Semiconductor Co., Ltd |
6 / 7 page SEMICONDUCTOR RoHS RoHS Nell High Power Products www.nellsemi.com Page 6 of 7 + - QG QGS QGD 10V VGS Charge Current Regulator Same Type as D.U.T. 12V 0.2µF 50KΩ 0.3µF VGS 3mA D.U.T. VDS RD RG Current Sampling Resistors Fig.13b. Gate charge test circuit Fig.13a. Basic gate charge waveform • • • P.W. Period di/dt Diode Recovery dv/dt Ripple ≤ 5% Body Diode Forward Drop Re-Applied Voltage Reverse Recovery Current Body Diode Forward Current VGS=10V VDD ISD Driver Gate Drive D.U.T. I SD Waveform D.U.T. VDS Waveform Inductor Curent D = P.W. Period * + - + + + - - - • • • • Circuit Layout Considerations Low Stray lnductance Ground Plane Low Leakage lnductance Current Transformer dv/dt controlled by RG Driver same type as D.U.T. l controlled by Duty Factor D SD " " D.U.T. -Device Under Test D.U.T. RG VDD *V = 5V for Logic Level Devices and 3V for drive devices GS Fig.14 Peak diode recovery dv/dt test circuit for N-Channel MOSFET Fig.12c. Maximum avalanche energy vs. Drain current 200 600 400 0 Starting Junction temperature, T (°C) J 25 50 75 100 125 150 800 IRF22N60 Series lD TOP BOTTOM 9.8A 14A 22A |
同様の部品番号 - IRF22N60 |
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同様の説明 - IRF22N60 |
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