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AD8008 データシート(PDF) 7 Page - Analog Devices |
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AD8008 データシート(HTML) 7 Page - Analog Devices |
7 / 21 page AD8007/AD8008 Rev. E | Page 6 of 20 ABSOLUTE MAXIMUM RATINGS Table 3. Parameter Rating Supply Voltage 12.6 V Power Dissipation See Figure 5 Common-Mode Input Voltage ±VS Differential Input Voltage ±1.0 V Output Short-Circuit Duration See Figure 5 Storage Temperature Range −65°C to +125°C Operating Temperature Range −40°C to +85°C Lead Temperature (Soldering, 10 sec) 300°C RMS output voltages should be considered. If RL is referenced to VS, as in single-supply operation, then the total drive power is VS × IOUT. If the rms signal levels are indeterminate, then consider the worst case, when VOUT = VS/4 for RL to midsupply L S S S D R V I V P 2 4 ) ( ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ + × = In single-supply operation, with RL referenced to VS, worst case is VOUT = VS/2. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Airflow increases heat dissipation, effectively reducing θJA. In addition, more metal directly in contact with the package leads from metal traces, through-holes, ground, and power planes reduces the θJA. Care must be taken to minimize parasitic capacitances at the input leads of high speed op amps, see the Layout Considerations section. Figure 5 shows the maximum safe power dissipation in the package vs. the ambient temperature for the SOIC-8 (125°C/W), MSOP-8 (150°C/W), and SC70-5 (210°C/W) packages on a JEDEC standard 4-layer board. θJA values are approximations. MAXIMUM POWER DISSIPATION The maximum safe power dissipation in the AD8007/AD8008 packages is limited by the associated rise in junction temperature (TJ) on the die. The plastic encapsulating the die locally reaches the junction temperature. At approximately 150°C, which is the glass transition temperature, the plastic changes its properties. Even temporarily exceeding this temperature limit can change the stresses that the package exerts on the die, permanently shifting the parametric performance of the AD8007/AD8008. Exceeding a junction temperature of 175°C for an extended time can result in changes in the silicon devices, potentially causing failure. AMBIENT TEMPERATURE (°C) 2.0 1.5 0 0 0 1 0 6 – –40 –20 0 20 40 60 80 1.0 0.5 SOIC-8 SC70-5 MSOP-8 The still-air thermal properties of the package and PCB (θJA), ambient temperature (TA), and the total power dissipated in the package (PD) determine the junction temperature of the die. The junction temperature can be calculated as TJ = TA + (PD × θJA) Figure 5. Maximum Power Dissipation vs. Temperature for a 4-Layer Board The power dissipated in the package (PD) is the sum of the quiescent power dissipation and the power dissipated in the package due to the load drive for all outputs. The quiescent power is the voltage between the supply pins (VS) times the quiescent current (IS). Assuming the load (RL ) is referenced to midsupply, the total drive power is VS/2 × IOUT, some of which is dissipated in the package and some in the load (VOUT × IOUT). The difference between the total drive power and the load power is the drive power dissipated in the package. OUTPUT SHORT CIRCUIT Shorting the output to ground or drawing excessive current for the AD8007/AD8008 will likely cause catastrophic failure. ESD CAUTION PD = Quiescent Power + (Total Drive Power − Load Power) L OUT L OUT S S S D R V R V V I V P 2 2 ) ( − ⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ × + × = |
同様の部品番号 - AD8008_15 |
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同様の説明 - AD8008_15 |
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