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AD9887 データシート(PDF) 5 Page - Analog Devices |
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AD9887 データシート(HTML) 5 Page - Analog Devices |
5 / 40 page REV. 0 –5– AD9887 Test AD9887KS Parameter Conditions Level Min Typ Max Unit AC SPECIFICATIONS (continued) High-to-Low Transition Time for DATACK (DHLT) Output Drive = High; CL =10 pF IV 1.4 ns Output Drive = Med; CL = 7 pF IV 1.7 ns Output Drive = Low; CL = 5 pF IV 2.1 ns Clock to Data Skew, tSKEW IV –0.5 +2.0 ns Duty Cycle, tDCYCLE IV 45 55 % of Period High DATACK Frequency (FCIP) (1 Pixel/Clock) VI 20 112 MHz DATACK Frequency (FCIP) (2 Pixels/Clock) IV 10 56 MHz NOTES 1The typical pattern contains a gray scale area, Output Drive = High. 2The worst-case pattern contains a black and white checkerboard pattern, Output Drive = High. 3The setup and hold times with respect to the DATACK rising edge are the same as the falling edge. 41 Pixel/clock mode, DATACK and DATACK Load = 10 pF, Data Load = 5 pF. CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD9887 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. WARNING! ESD SENSITIVE DEVICE ABSOLUTE MAXIMUM RATINGS* VD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.6 V VDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.6 V Analog Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . VD to 0.0 V VREF IN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VD to 0.0 V Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 V to 0.0 V Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . . 20 mA Operating Temperature . . . . . . . . . . . . . . . . . –25 °C to +85°C Storage Temperature . . . . . . . . . . . . . . . . . . –65 °C to +150°C Maximum Junction Temperature . . . . . . . . . . . . . . . . 150 °C Maximum Case Temperature . . . . . . . . . . . . . . . . . . . 150 °C *Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions outside of those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability. EXPLANATION OF TEST LEVELS Test Level Explanation I 100% production tested. II 100% production tested at 25 °C and sample tested at specified temperatures. III Sample tested only. IV Parameter is guaranteed by design and charac- terization testing. V Parameter is a typical value only. VI 100% production tested at 25 °C; guaranteed by design and characterization testing. ORDERING GUIDE Temperature Package Package Model Range Description Option AD9887KS-140 0 °C to 70°C Plastic Quad Flatpack S-160 AD9887KS-100 0 °C to 70°C Plastic Quad Flatpack S-160 AD9887/PCB 25 °C Evaluation Board |
同様の部品番号 - AD9887_15 |
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同様の説明 - AD9887_15 |
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