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LF3304 データシート(PDF) 11 Page - LOGIC Devices Incorporated |
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LF3304 データシート(HTML) 11 Page - LOGIC Devices Incorporated |
11 / 12 page DEVICES INCORPORATED Video Imaging Products 11 LF3304 Dual Line Buffer/FIFO 08/16/2000–LDS.3304-F 1. Maximum Ratings indicate stress specifications only. Functional oper- ation of these products at values beyond those indicated in the Operating Condi- tions table is not implied. Exposure to maximum rating conditions for ex- tended periods may affect reliability. 2. The products described by this spec- ification include internal circuitry de- signedtoprotect the chipfromdamaging substrate injection currents and accu- mulations of static charge. Neverthe- less, conventional precautions should be observed during storage, handling, and use of these circuits in order to avoid exposure to excessive electrical stress values. 3. This device provides hard clamping of transient undershoot. Input levels below ground will be clamped begin- ning at –0.6 V. The device can withstand indefinite operation with inputs or out- puts in the range of –0.5 V to +5.5 V. Device operation will not be adversely affected, however, input current levels will be well in excess of 100 mA. 4. Actual test conditions may vary from those designated but operation is guar- anteed as specified. 5. Supply current for a given applica- tion can be accurately approximated by: where N = total number of device outputs C = capacitive load per output V = supply voltage F = clock frequency 6. Tested with outputs changing every cycle and no load, at a 40 MHz clock rate. 7. Tested with all inputs within 0.1 V of VCC or Ground, no load. 8. These parameters are guaranteed but not 100% tested. 9. AC specifications are tested with NCV F 4 2 NOTES input transition times less than 3 ns, output reference levels of 1.5 V (except tDIS test), and input levels of nominally 0 to 3.0 V. Output loading may be a resistive divider which provides for specified IOH and IOL at an output voltage of VOH min and VOL max respectively. Alternatively, a diode bridge with upper and lower current sources of IOH and IOL respectively, and a balancing voltage of 1.5 V may be used. Parasitic capacitance is 30 pF minimum, and may be distributed. This device has high-speed outputs ca- pable of large instantaneous current pulses and fast turn-on/turn-off times. As a result, care must be exercised in the testing of this device. The following measures arerecommended: a. A 0.1 µF ceramic capacitor should be installed between VCC and Ground leads as close to the Device Under Test (DUT) as possible. Similar capacitors should be installed between device VCC and the tester common, and device ground and tester common. b. Ground and VCC supply planes must be brought directly to the DUT socket or contactor fingers. c. Input voltages on a test fixture should be adjusted to compensate for inductive ground and VCC noise to maintain re- quired DUT input levels relative to the DUT ground pin. 10. Each parameter is shown as a mini- mum or maximum value. Input require- mentsarespecifiedfromthepointofview of the external system driving the chip. Setup time, for example, is specified as a minimumsincetheexternalsystemmust supplyatleastthatmuchtimetomeetthe worst-case requirements of all parts. Responses from the internal circuitry are specified from the point of view of the device. Output delay, for example, is specified as a maximum since worst- case operation of any device always pro- vides data within that time. 11. For the tENA test, the transition is measured to the 1.5 V crossing point with datasheet loads. For the tDIS test, the transition is measured to the ±200mV level from the measured steady-state output voltage with ±10mA loads. The balancing voltage, VTH, is set at 3.0 V for Z-to-0 and 0-to-Z tests, and set at 0 V for Z-to-1 and 1-to-Z tests. 12. These parameters are only tested at the high temperature extreme, which is the worst case for leakage current. S1 IOH IOL VTH CL DUT OE 0.2 V tDIS tENA 0.2 V 1.5 V 1.5 V 3.0V Vth 1 Z 0 Z Z 1 Z 0 1.5 V 1.5 V 0V Vth VOL* VOH* VOL* VOH* Measured VOL with IOH = –10mA and IOL = 10mA Measured VOH with IOH = –10mA and IOL = 10mA FIGURE B. THRESHOLD LEVELS FIGURE A. OUTPUT LOADING CIRCUIT |
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同様の説明 - LF3304 |
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