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74HC_HCT157 データシート(PDF) 10 Page - NXP Semiconductors |
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74HC_HCT157 データシート(HTML) 10 Page - NXP Semiconductors |
10 / 19 page 74HC_HCT157 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved. Product data sheet Rev. 7 — 21 January 2015 10 of 19 NXP Semiconductors 74HC157; 74HCT157 Quad 2-input multiplexer Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 9. Test circuit for measuring switching times Table 9. Test data Type Input Load Test VI tr, tf CL 74HC157 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT157 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
同様の部品番号 - 74HC_HCT157_15 |
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同様の説明 - 74HC_HCT157_15 |
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