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CD4512BC データシート(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部品番号 CD4512BC
部品情報  8-Channel Buffered Data Selector
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

CD4512BC データシート(HTML) 3 Page - National Semiconductor (TI)

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DC Electrical Characteristics CD4512BC (Note 2) (Continued)
Symbol
Parameter
Conditions
b
40 C
a
25 C
a
85 C
Units
Min
Max
Min
Typ
Max
Min
Max
VIH
High Level
VDD e 5V VO e 45V
35
35
275
35
V
Input Voltage
VDD e 10V VO e 90V
70
70
550
70
V
VDD e 15V VO e 135V
110
110
825
110
V
IOL
Low Level Output
VDD e 5V VO e 04V
052
044
078
036
mA
Current
VDD e 10V VO e 05V
13
11
20
09
mA
(Note 3)
VDD e 15V VO e 15V
36
34
78
24
mA
IOH
High Level Output
VDD e 5V VO e 46V
b
02
b
016
b
012
mA
Current
VDD e 10V VO e 95
b
05
b
04
b
03
mA
(Note 3)
VDD e 15V VO e 135V
b
14
b
12
b
10
mA
IIN
Input Current
VDD e 15V VIN e 0V
b
03
b
10b5
b
03
b
10
m
A
VDD e 15V VIN e 15V
03
10b5
03
10
m
A
IOZ
TRI-STATE
VDD e 15V VO e 0V
g
10
g
10b5
g
10
g
75
m
A
Output Current
VDD e 15V VO e 15V
AC Electrical Characteristics TA e 25 C tr e tf e 20 ns CL e 50 pF
Symbol
Parameter
Conditions
CD4512BM
CD4512BC
Units
Min
Typ
Max
Min
Typ
Max
tPHL
Propagation Delay
VDD e 5V
225
500
225
750
ns
High-to-Low Level
VDD e 10V
75
175
75
200
ns
VDD e 15V
57
130
57
150
ns
tPLH
Propagation Delay
VDD e 5V
225
500
225
750
ns
Low-to-High Level
VDD e 10V
75
175
75
200
ns
VDD e 15V
57
130
57
150
ns
tTHL tTLH
Transition Time
VDD e 5V
70
200
70
200
ns
VDD e 10V
35
100
35
100
ns
VDD e 15V
25
80
25
80
ns
tPHZ tPLZ
Propagation Delay into
VDD e 5V
50
125
50
125
ns
TRI-STATE from Logic Level
VDD e 10V
25
75
25
75
ns
VDD e 15V
19
60
19
60
ns
tPZH tPZL
Propagation Delay to Logic
VDD e 5V
50
125
50
125
ns
Level from TRI-STATE
VDD e 10V
25
75
25
75
ns
VDD e 15V
19
60
19
60
ns
CIN
Input Capacitance
(Note 4)
75
15
75
15
pF
COUT
TRI-STATE Output
(Note 4)
75
15
75
15
pF
Capacitance
CPD
Power Dissipation Capacity
(Note 5)
150
150
pF
AC Parameters are guaranteed by DC correlated testing
Note 1
‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed They are not meant to imply that the devices
should be operated at these limits The tables of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provide conditions for actual device
operation
Note 2
VSS e 0V unless otherwise specified
Note 3
IOH and IOL are tested one output at a time
Note 4
Capacitance guaranteed by periodic testing
Note 5
CPD determines the no load AC power of any CMOS device For complete explanation see 54C74C Family Characteristics Application Note AN-90
3


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