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9ZXL0831 データシート(PDF) 5 Page - Integrated Device Technology

部品番号 9ZXL0831
部品情報  8-OUTPUT
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メーカー  IDT [Integrated Device Technology]
ホームページ  http://www.idt.com
Logo IDT - Integrated Device Technology

9ZXL0831 データシート(HTML) 5 Page - Integrated Device Technology

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9ZXL0831
8-OUTPUT DB800ZL
IDT®
8-OUTPUT DB800ZL
5
9ZXL0831
REV E 081616
Absolute Maximum Ratings
Stresses above the ratings listed below can cause permanent damage to the 9ZXL0831. These ratings, which are standard
values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any other
conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over
the recommended operating temperature range.
Electrical Characteristics–DIF_IN Clock Input Parameters (HCSL-compatible)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS NOTES
3.3V Supply Voltage
VDD, VDDA,
VDDR
VDD for core logic and PLL
4.6
V
1,2
Input Low Voltage
VIL
GND-0.5
V
1
Input High Voltage
VIH
Except for SMBus interface
VDD+0.5V
V
1
Input High Voltage
VIHSMB
SMBus clock and data pins
5.5V
V
1
Storage Temperature
Ts
-65
150
°C
1
Junction Temperature
Tj
125
°C
1
Input ESD protection
ESD prot
Human Body Model
2000
V
1
1Guaranteed by design and characterization, not 100% tested in production.
2 Operation under these conditions is neither implied nor guaranteed.
TA = TCOM; Supply Voltage VDD = 3.3 V +/-5%
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS NOTES
Input Crossover Voltage -
DIF_IN
VCROSS
Cross Over Voltage
150
900
mV
1
Input Swing - DIF_IN
VSWING
Differential value
300
mV
1
Input Slew Rate - DIF_IN
dv/dt
Measured differentially
0.4
8
V/ns
1,2
Input Leakage Current
IIN
VIN = VDD , VIN = GND
-5
5
uA
Input Duty Cycle
dtin
Measurement from differential wavefrom
45
55
%
1
Input Jitter - Cycle to Cycle
JDIFIn
Differential Measurement
0
125
ps
1
1 Guaranteed by design and characterization, not 100% tested in production.
2Slew rate measured through +/-75mV window centered around differential zero


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