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AD5245BRJ50-RL7 データシート(PDF) 10 Page - Analog Devices |
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AD5245BRJ50-RL7 データシート(HTML) 10 Page - Analog Devices |
10 / 16 page AD5245 Rev. 0 | Page 10 of 16 TEST CIRCUITS Figure 27 to Figure 35 illustrate the test circuits that define the test conditions used in the product specification tables. VMS A W B DUT V+ = VDD 1LSB = V+/2N V+ Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Figure 28. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS1 IW = VDD/RNOMINAL VMS2 VW RW = [VMS1 – VMS2]/IW A W B DUT Figure 29. Test Circuit for Wiper Resistance ∆V ∆V ∆V ∆VMS% DD% PSS (%/%) = V+= VDD 10% PSRR (dB) = 20 LOG MS DD ( ) VDD VA VMS A W B V+ Figure 30. Test Circuit for Power Supply Sensitivity (PSS, PSSR) OP279 W 5V B VOUT OFFSET GND OFFSET BIAS A DUT VIN Figure 31. Test Circuit for Inverting Gain B A VIN OP279 W 5V VOUT OFFSET GND OFFSET BIAS DUT Figure 32. Test Circuit for Noninverting Gain +15V –15V W A 2.5V B VOUT OFFSET GND DUT AD8610 VIN Figure 33. Test Circuit for Gain vs. Frequency W B VSS TO VDD DUT ISW CODE = 0x00 RSW = 0.1V ISW 0.1V Figure 34. Test Circuit for Incremental ON Resistance W B VCM ICM A NC GND NC VSS VDD DUT NC = NO CONNECT Figure 35. Test Circuit for Common-Mode Leakage current |
同様の部品番号 - AD5245BRJ50-RL7 |
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同様の説明 - AD5245BRJ50-RL7 |
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