データシートサーチシステム |
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54ABT240W-QML データシート(PDF) 6 Page - National Semiconductor (TI) |
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54ABT240W-QML データシート(HTML) 6 Page - National Semiconductor (TI) |
6 / 11 page MN54ABT240-X REV 0B0 MICROCIRCUIT DATA SHEET Electrical Characteristics AC PARAMETERS (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS tpLH Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 2, 5 In to On 1.0 4.3 ns 9 2, 5 In to On 0.8 5.5 ns 10, 11 tpHL Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 2, 5 In to On 1.0 4.5 ns 9 2, 5 In to On 1.0 5.5 ns 10, 11 tpZL Output Enable Time VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 2, 5 OE to On 1.1 6.2 ns 9 2, 5 OE to On 0.8 7.7 ns 10, 11 tpZH Output Enable Time VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 2, 5 OE to On 1.1 5.8 ns 9 2, 5 OE to On 0.8 7.5 ns 10, 11 tpHZ Output Disable Time VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 2, 5 OE to On 1.5 5.9 ns 9 2, 5 OE to On 1.0 7.5 ns 10, 11 tpLZ Output Disable Time VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 2, 5 OE to On 1.5 5.9 ns 9 2, 5 OE to On 1.0 7.2 ns 10, 11 Note 1: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS 1,2,3,7 & 8. Note 2: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +25C & +125C TEMP., SUBGROUPS A9, A10 & A11. Note 3: SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMP. ONLY, SUBGROUP 9. Note 4: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP., SUBGROUPS A1, 2, 3, 7 & 8. Note 5: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP., SUBGROUPS A9, 10, & 11. Note 6: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C TEMP ONLY, SUBGROUP A9. Note 7: NOT TESTED (GUARANTEED BY DESIGN CHARACTERIZATION DATA). Note 8: MAX NUMBER OF OUTPUTS DEFINED AS (N). N-1 DATA INPUTS ARE DRIVEN 0V TO 3.0V. ONE OUTPUT @ VOL OR @ VOH. Note 9: MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3.0V. INPUT-UNDERTEST SWITCHING: 3V TO THRESHOLD (VILD), 0V TO THRESHOLD (VIHD), FREQ.= 1 MHZ. Note 10: MAXIMUM TEST DURATION NOT TO EXCEED ONE SECOND, NOT MORE THAN ONE OUTPUT SHORTED AT ONE TIME. 6 |
同様の部品番号 - 54ABT240W-QML |
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同様の説明 - 54ABT240W-QML |
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