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MC145506P データシート(PDF) 10 Page - LANSDALE Semiconductor Inc. |
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MC145506P データシート(HTML) 10 Page - LANSDALE Semiconductor Inc. |
10 / 20 page ML145506 LANSDALE Semiconductor, Inc. of 1.0, such that a 3 dBm0 signal at TxI corresponds to the peak converter reference voltage as described in the Vref and RSI pin descriptions. For a 3.15 V reference, the 3 dBm0 input should be 6.3 V peak–to–peak. +Tx/ –Tx Positive Tx Amplifier Input Negative Tx Amplifier Input The Txl pin is the input to the transmit band–pass filter. If +Tx or –Tx is available, then there is an internal amplifier preceding the fil- ter whose pins are +Tx, –Tx, and TxI. These pins allow access to the amplifier terminals to tailor the input gain with external resistors. The resistors should be in the range of 10 kΩ. POWER SUPPLIES VDD Most Positive Power Supply VDD is typically 5 V to 12 V. VSS Most Negative Power Supply VSS is typically 10 V to 12 V negative of VDD. For a ±5 V dual–supply system, the typical power supply configuration is VDD = 5 V, VSS = –5 V, VLS = 0 V (digital ground accommodat- ing TTL logic levels), and VAG = 0 V being tied to system analog ground. For single–supply applications, typical power supply configura- tions include: VDD = 10 V to 12 V VSS = 0 V VAG generates a mid supply voltage for referencing all analog signals. VLS controls the logic levels. This pin should be connected to VDD for CMOS logic levels from VSS to VDD. This pin should be connected to digital ground for true TTL logic input levels refer- enced to VLS, with HCMOS output levels from VLS to VDD. TESTING CONSIDERATIONS An analog test mode is activated by connecting MSI and CCI to 128 kHz. In this mode, the input of the A/D (the output of the Tx filter) is available at the PDI pin. This input is direct coupled to the A/D side of the codec. The A/D is a differential design. This results in the gain of this input being effectively attenuated by half. If moni- tored with a high–impedance buffer, the output of the Tx low–pass filter can also be measured at the PDI pin. This test mode allows independent evaluation of the transmit low–pass filter and A/D side of the codec. The transmit and receive channels of these devices are tested with the codec–filter fully functional. www.lansdale.com Page 10 of 20 Issue A |
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