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HCF4052M013TR データシート(PDF) 4 Page - STMicroelectronics |
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HCF4052M013TR データシート(HTML) 4 Page - STMicroelectronics |
4 / 11 page HCF4052B 4/11 DC SPECIFICATIONS * Determined by minimum feasible leakage measurement for automating testing. Symbol Parameter Test Condition Value Unit VIS (V) VEE (V) VSS (V) VDD (V) TA = 25°C -40 to 85°C -55 to 125°C Min. Typ. Max. Min. Max. Min. Max. IL Quiescent Device Current (all switches ON or all switches OFF) 5 0.04 5 150 150 µA 10 0.04 10 300 300 15 0.04 20 600 600 20 0.08 100 3000 3000 SWITCH RON Resistance 0< VI < VDD 00 5 470 1050 1200 1200 Ω 10 180 400 520 520 15 125 280 360 360 ∆ ON Resistance ∆ RON (between any 2 of 4 switches) 0< VI < VDD 00 510 Ω 10 10 15 5 OFF* Channel Leakage Current (All Channel OFF) (COMMON O/I) 00 18 ±0.1 100 1000 1000 nA OFF* Channel Leakage Current (Any Channel OFF) 00 18 ±0.1 100 1000 1000 nA CI Input Capacitance -5 -5 5 5 pF CO Output Capacitance 18 CIO Feed through 0.2 CONTROL (Address or Inhibit) VIL Input Low Voltage = VDD thru 1K Ω VEE =VSS RL =1KΩ to VSS IIS <2µA (on all OFF channels) 5 1.5 1.5 1.5 V 10 3 3 3 15 4 4 4 VIH Input High Voltage 5 3.5 3.5 3.5 V 10 7 7 7 15 11 11 11 IIH, IIL Input Leakage Current VI = 0/18V 18 ±10-3 ±0.1 ±1 ±1 µA CI Input Capacitance 5 7.5 pF |
同様の部品番号 - HCF4052M013TR |
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同様の説明 - HCF4052M013TR |
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