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CAT24FC64PETE13REV-D データシート(PDF) 2 Page - Catalyst Semiconductor |
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CAT24FC64PETE13REV-D データシート(HTML) 2 Page - Catalyst Semiconductor |
2 / 10 page CAT24FC64 2 Doc. No. 1046, Rev. G ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –55 °C to +125°C Storage Temperature ....................... –65 °C to +150°C Voltage on Any Pin with Respect to Ground(1) ........... –2.0V to +VCC + 2.0V VCC with Respect to Ground ............... –2.0V to +7.0V *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. Note: (1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC + 2.0V for periods of less than 20ns. (2) Output shorted for no more than one second. No more than one output shorted at a time. (3) This parameter is tested initially and after a design or process change that affects the parameter. (4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V. (5) Standby current (ISB ) = 10 µA max at extended temperature range. Symbol Parameter Test Conditions Min Typ Max Units ICC1 Power Supply Current - Read fSCL = 100 KHz 1 mA VCC=5V ICC2 Power Supply Current - Write fSCL = 400KHz 3 mA VCC=5V ISB(5) Standby Current VIN = GND or VCC 1 µA VCC=5V ILI Input Leakage Current VIN = GND to VCC 1 µA ILO Output Leakage Current VOUT = GND to VCC 1 µA VIL Input Low Voltage -0.5 VCC x 0.3 V VIH Input High Voltage VCC x 0.7 VCC + 0.5 V VOL1 Output Low Voltage (VCC = +3.0V) IOL = 3.0 mA 0.4 V VOL2 Output Low Voltage (VCC = +1.8V) IOL = 1.5 mA 0.5 V RELIABILITY CHARACTERISTICS Symbol Parameter Reference Test Method Min Typ Max Units NEND(3) Endurance MIL-STD-883, Test Method 1033 1,000,000 Cycles/Byte TDR(3) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP(3) ESD Susceptibility MIL-STD-883, Test Method 3015 4000 Volts ILTH(3)(4) Latch-up JEDEC Standard 17 100 mA CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5V Symbol Test Conditions Min Typ Max Units CI/O(3) Input/Output Capacitance (SDA) VI/O = 0V 8 pF CIN(3) Input Capacitance (SCL, WP, A0, A1) VIN = 0V 6 pF ZWPL WP Input Impedance VIN ≤ 0.5V 5 70 k Ω ZWPH WP Input Impedance VIN>0.7VxVCC 500 k Ω D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +5.5V, unless otherwise specified. Package Power Dissipation Capability (Ta = 25 °C)................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300 °C Output Short Circuit Current(2) ........................ 100mA |
同様の部品番号 - CAT24FC64PETE13REV-D |
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同様の説明 - CAT24FC64PETE13REV-D |
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