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ISL5727IN データシート(PDF) 10 Page - Intersil Corporation

部品番号 ISL5727IN
部品情報  Dual 10-bit, 3.3V, 260MSPS, High Speed D/A Converter
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メーカー  INTERSIL [Intersil Corporation]
ホームページ  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation

ISL5727IN データシート(HTML) 10 Page - Intersil Corporation

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10
Definition of Specifications
Adjacent Channel Power Ratio, ACPR, is the ratio of the
average power in the adjacent frequency channel (or offset)
to the average power in the transmitted frequency channel.
Crosstalk, is the measure of the channel isolation from one
DAC to the other. It is measured by generating a sinewave in
one DAC while the other DAC is clocked with a static input,
and comparing the output power of each DAC at the
frequency generated.
Differential Linearity Error, DNL, is the measure of the
step size output deviation from code to code. Ideally the step
size should be one LSB. A DNL specification of one LSB or
less guarantees monotonicity.
EDGE, Enhanced Data for Global Evolution, a TDMA
standard for cellular applications which uses 200kHz BW,
8-PSK modulated carriers.
Full Scale Gain Drift, is measured by setting the data inputs
to be all logic high (all 1s) and measuring the output voltage
through a known resistance as the temperature is varied
from TMIN to TMAX. It is defined as the maximum deviation
from the value measured at room temperature to the value
measured at either TMIN or TMAX. The units are ppm of FSR
(full scale range) per °C.
Full Scale Gain Error, is the error from an ideal ratio of 32
between the output current and the full scale adjust current
(through RSET).
Gain Matching, is a measure of the full scale amplitude
match between the I and Q channels given the same input
pattern. It is typically measured with all 1s at the input to both
channels, and the full scale output voltage developed into
matching loads is compared for the I and Q outputs.
GSM, Global System for Mobile Communication, a TDMA
standard for cellular applications which uses 200kHz BW,
GMSK modulated carriers.
Integral Linearity Error, INL, is the measure of the worst
case point that deviates from a best fit straight line of data
values along the transfer curve.
Internal Reference Voltage Drift, is defined as the
maximum deviation from the value measured at room
temperature to the value measured at either TMIN or TMAX.
The units are ppm per °C.
Offset Drift, is measured by setting the data inputs to all
logic low (all 0s) and measuring the output voltage at IOUTA
through a known resistance as the temperature is varied
from TMIN to TMAX. It is defined as the maximum deviation
from the value measured at room temperature to the value
measured at either TMIN or TMAX. The units are ppm of FSR
(full scale range) per degree °C.
Offset Error, is measured by setting the data inputs to all
logic low (all 0s) and measuring the output voltage of IOUTA
through a known resistance. Offset error is defined as the
maximum deviation of the IOUTA output current from a value
of 0mA.
Output Voltage Compliance Range, is the voltage limit
imposed on the output. The output impedance should be
chosen such that the voltage developed does not violate the
compliance range.
Power Supply Rejection, is measured using a single power
supply. The nominal supply voltage is varied ±10% and the
change in the DAC full scale output is noted.
Reference Input Multiplying Bandwidth, is defined as the
3dB bandwidth of the voltage reference input. It is measured
by using a sinusoidal waveform as the external reference
with the digital inputs set to all 1s. The frequency is
increased until the amplitude of the output waveform is
0.707 (-3dB) of its original value.
Spurious Free Dynamic Range, SFDR, is the amplitude
difference from the fundamental signal to the largest
harmonically or non-harmonically related spur within the
specified frequency window.
Total Harmonic Distortion, THD, is the ratio of the RMS
value of the fundamental output signal to the RMS sum of
the first five harmonic components.
UMTS, Universal Mobile Telecommunications System, a
W-CDMA standard for cellular applications which uses
3.84MHz modulated carriers.
Detailed Description
The ISL5727 is a dual 10-bit, current out, CMOS, digital to
analog converter. The maximum update rate is at least
260+MSPS and can be powered by a single power supply in
the recommended range of +3.0V to +3.6V. It consumes less
than 125mW of power per channel when using a +3.3V
supply, the maximum 20mA of output current, and the data
switching at 210MSPS. The architecture is based on a
segmented current source arrangement that reduces glitch
by reducing the amount of current switching at any one time.
In previous architectures that contained all binary weighted
current sources or a binary weighted resistor ladder, the
converter might have a substantially larger amount of current
turning on and off at certain, worst-case transition points
such as midscale and quarter scale transitions. By greatly
reducing the amount of current switching at these major
transitions, the overall glitch of the converter is dramatically
reduced, improving settling time, transient problems, and
accuracy.
Digital Inputs and Termination
The ISL5727 digital inputs are formatted as offset binary and
guaranteed to 3V LVCMOS levels. The internal register is
updated on the rising edge of the clock. To minimize
reflections, proper termination should be implemented. If the
lines driving the clock and the digital inputs are long 50
ISL5727


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