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TPS746-Q1 データシート(PDF) 30 Page - Texas Instruments

部品番号 TPS746-Q1
部品情報  TPS746-Q1 1-A LDO With Power-Good in Small Wettable Flank WSON Packages
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メーカー  TI [Texas Instruments]
ホームページ  http://www.ti.com
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TPS746-Q1 データシート(HTML) 30 Page - Texas Instruments

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TPS746-Q1
SBVS358A – JUNE 2018 – REVISED OCTOBER 2019
www.ti.com
Product Folder Links: TPS746-Q1
Submit Documentation Feedback
Copyright © 2018–2019, Texas Instruments Incorporated
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
device product folder on www.ti.com.
(2)
Output voltages from 0.65 V to 5.0 V in 50-mV increments are available. Contact the factory for details and availability.
11 Device and Documentation Support
11.1 Device Support
11.1.1 Device Nomenclature
Table 3. Device Nomenclature(1)(2)
PRODUCT
VOUT
TPS746)xx(x)PvQWyyyzQ1
xx(x) is the nominal output voltage. For output voltages with a resolution of 100 mV, two digits are used
in the ordering number; otherwise, three digits are used (for example, 28 = 2.8 V; 125 = 1.25 V; 01 =
adjustable).
P indicates an active output discharge feature. All members of the TPS746 family will actively discharge
the output when the device is disabled.
v indicates the topology of the power-good output and the timing associated with the power-good delay.
If unused, indicates an open-drain power-good output with a 150-µs delay.
If B, indicates an open-drain, power-good output with a 5-ms delay.
If C, indicates a push-pull, power-good output with a 150-µs delay.
Q indicates that this device is a Grade-1 device in accordance with the AEC-Q100 standard.
W indicates the package has wettable flanks.
yyy is the package designator.
z is the package quantity. R is for reel (3000 pieces).
Q1 indicates that this device is an automotive grade (AEC-Q100) device.
11.2 Documentation Support
11.2.1 Related Documentation
For related documentation see the following:
Texas Instruments, Pros and Cons of Using a Feedforward Capacitor with a Low-Dropout Regulator
application report
Texas Instruments, An Empirical Analysis of the Impact of Board Layout on LDO Thermal Performance
application report
11.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
11.4 Community Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.5 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
11.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.


同様の部品番号 - TPS746-Q1_V03

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同様の説明 - TPS746-Q1_V03

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