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FOD0708R1 データシート(PDF) 3 Page - Fairchild Semiconductor

部品番号 FOD0708R1
部品情報  Optocouplers consist of an AlGaAs LED optically coupled to a high speed trans-impedance amplifier and voltage comparator
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メーカー  FAIRCHILD [Fairchild Semiconductor]
ホームページ  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

FOD0708R1 データシート(HTML) 3 Page - Fairchild Semiconductor

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FOD0708/FOD0738 Rev. 1.0.6
Switching Characteristics Over recommended temperature (TA = –40°C to +100°C) and
4.5 V
≤ VDD ≤ 5.5 V. All typical specifications are at TA = 25°C, VDD = +5 V.
*All typicals at TA = 25°C and VDD = 5V unless otherwise noted.
Isolation Characteristics (TA = -40°C to +100°C Unless otherwise specified.)
** All typical values are at VCC = 5 V, TA = 25°C
Notes:
1.
Propagation delay time, high to low (tPHL), is measured from the 50% level on the rising edge of the input pulse to the 2.5V level
of the falling edge of the output voltage signal. Propagation delay time, low to high (tPLH), is measured from the 50% level on the
falling edge of the input pulse to the 2.5V level of the rising edge of the output voltage signal.
2.
Pulse width distoration is defined as the absolute difference between the high to low and low to high propagation delay times,
| tPHL – tPLH |.
3.
Propagation delay skew, tPSK, is defined as the worst case difference in tPHL or tPLH between units within the recommended
operating range of the device.
4.
CMH – The maximum tolerated rate of rise of the common mode voltage to ensure the output will remain in the high state,
(i,e., VOUT > 2.0V) Measured in kilovolts per microsecond (kV/µs).
5.
CML – The maximum tolerated rate of fall of the common mode voltage to ensure the output will remain in the low state,
(i,e., VOUT < 0.8V). Measured in kilovolts per microsecond (kV/µs).
6.
Isolation voltage, VISO, is an internal device dielectric breakdown rating. For this test, pins 1,2,3,4 are common, and pins 5,6,7,8
are common.
Symbol
Parameter
Test Conditions
Min.
Typ.* Max.
Units
tPHL
Propagation Delay Time to
Logic Low Output
IF = 12 mA, CL = 15 pF
CMOS Signal Levels, note 1, fig. 10
20
60
ns
tPLH
Propagation Delay Time to
Logic High Output
IF = 12 mA, CL = 15 pF
CMOS Signal Levels,
note 1, fig. 10
FOD0708
13
60
ns
FOD0738
11
60
PW
Pulse Width
100
ns
| PWD |
Pulse Width Distortion
IF = 12 mA, CL = 15 pF
CMOS Signal Levels, note 2
0
30
ns
tPSK
Propagation Delay Skew
IF = 12 mA, CL = 15 pF
CMOS Signal Levels, note 3
40
ns
tR
Output Rise Time (10%–90%) IF = 12 mA, CL = 15 pF
CMOS Signal Levels
12
ns
tF
Output Fall Time (90%–10%)
IF = 12 mA, CL = 15 pF
CMOS Signal Levels
8
ns
| CMH |
Common Mode Transient
Immunity at Logic High
Output
VCM = 1000 V, TA = 25°C, IF = 0 mA,
note 4, fig. 11
25
50
kV/µs
| CML |
Common Mode Transient
Immunity at Logic Low Output
VCM = 1000 V, TA = 25°C, IF = 12 mA,
note 5, fig. 11
25
50
kV/µs
Characteristics
Test Conditions Symbol
Min
Typ.**
Max
Unit
Input-Output Insulation
Leakage Current
(Relative humidity = 45%)
(TA = 25°C, t = 5 s)
(VI-O = 3000 VDC) (Note 6)
II-O
1.0
µA
Withstand Insulation
Test Voltage
(II-O ≤ 10 µA, RH < 50%,
TA = 25°C) (t = 1 min.) (Note 6)
VISO
2500
VRMS
Resistance (Input to Output)
(VI-O = 500 V) (Note 6)
RI-O
1012
Capacitance (Input to Output)
(f = 1 MHz) (Note 6)
CI-O
0.6
pF


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