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TC55NEM216ASTV70 データシート(PDF) 4 Page - Toshiba Semiconductor

部品番号 TC55NEM216ASTV70
部品情報  TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
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メーカー  TOSHIBA [Toshiba Semiconductor]
ホームページ  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TC55NEM216ASTV70 データシート(HTML) 4 Page - Toshiba Semiconductor

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TC55NEM216ASTV55,70
2002-10-30
4/12
DC CHARACTERISTICS (Ta = −40° to 85°C, VDD = 5 V ± 10%)
SYMBOL
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
IIL
Input Leakage
Current
VIN = 0 V~VDD
±1.0
µA
IOH
Output High Current
VOH = 2.4 V
−1.0
mA
IOL
Output Low Current
VOL = 0.4 V
2.1
mA
ILO
Output Leakage
Current
CE
= VIH or CS = VIL or LB = UB = VIH or
R/W
= VIL or OE = VIH, VOUT = 0 V~VDD
±1.0
µA
MIN
35
lDDO1
CE
= VIL and CS = VIH and
R/W
= VIH, LB = UB = VIL,
IOUT = 0 mA,
Other Input
= VIH/VIL
tcycle
1
µs
8
mA
MIN
30
lDDO2
Operating Current
CE
= 0.2 V and CS = VDD − 0.2 V and
R/W
= VDD − 0.2 V, LB = UB = 0.2 V,
IOUT = 0 mA,
Other Input
= VDD − 0.2 V/0.2 V
tcycle
1
µs
3
mA
IDDS1
1) CE
= VIH
2) CS
= VIL
3) LB
= UB = VIH
3
mA
Ta
= 25°C
1
Ta
= −40~40°C
3
IDDS2
Standby Current
1) CE
= VDD − 0.2 V
2) CS
= 0.2 V
3) LB
= UB = VDD − 0.2 V, CE = 0.2 V,
CS
= VDD − 0.2 V
Ta
= −40~85°C
20
µA
DC CHARACTERISTICS (Ta = −40° to 85°C, VDD = 3 V ± 10%)
SYMBOL
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
IIL
Input Leakage
Current
VIN = 0 V~VDD
±1.0
µA
IOH
Output High Current
VOH = VDD − 0.2 V
−0.1
mA
IOL
Output Low Current
VOL = 0.2 V
0.1
mA
ILO
Output Leakage
Current
CE
= VIH or CS = VIL or LB = UB = VIH or
R/W
= VIL or OE = VIH, VOUT = 0 V~VDD
±1.0
µA
MIN
30
IDDO2
Operating Current
CE
= 0.2 V and CS = VDD − 0.2 V and
R/W
= VDD − 0.2 V, LB = UB = 0.2 V,
IOUT = 0 mA,
Other Input
= VDD − 0.2 V/0.2 V
tcycle
1
µs
3
mA
Ta
= 25°C
1
Ta
= −40~40°C
3
IDDS2
Standby Current
1) CE
= VDD − 0.2 V
2) CS
= 0.2 V
3) LB
= UB = VDD − 0.2 V, CE = 0.2 V,
CS
= VDD − 0.2 V
Ta
= −40~85°C
20
µA
CAPACITANCE (Ta = 25°C, f = 1 MHz)
SYMBOL
PARAMETER
TEST CONDITION
MAX
UNIT
CIN
Input Capacitance
VIN = GND
10
pF
COUT
Output Capacitance
VOUT = GND
10
pF
Note:
This parameter is periodically sampled and is not 100% tested.


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