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STK22C48
December 2002
3
Document Control # ML0004 rev 0.0
SRAM READ CYCLES #1 & #2
(VCC = 5.0V ± 10%)e
Note g: W and HSB must be high during SRAM READ cycles.
Note h: Device is continuously selected with E and G both low.
Note i:
Measured
± 200mV from steady state output voltage.
SRAM READ CYCLE #1: Address Controlledg, h
SRAM READ CYCLE #2: E Controlledg
NO.
SYMBOLS
PARAMETER
STK22C48-25
STK22C48-35
STK22C48-45
UNITS
#1, #2
Alt.
MIN
MAX
MIN
MAX
MIN
MAX
1tELQV
tACS
Chip Enable Access Time
25
35
45
ns
2tAVAVg
tRC
Read Cycle Time
25
35
45
ns
3tAVQVh
tAA
Address Access Time
25
35
45
ns
4tGLQV
tOE
Output Enable to Data Valid
10
15
20
ns
5tAXQXh
tOH
Output Hold after Address Change
5
5
5
ns
6tELQX
tLZ
Chip Enable to Output Active
5
5
5
ns
7tEHQZi
tHZ
Chip Disable to Output Inactive
10
13
15
ns
8tGLQX
tOLZ
Output Enable to Output Active
0
0
0
ns
9tGHQZi
tOHZ
Output Disable to Output Inactive
10
13
15
ns
10
tELICCHf
tPA
Chip Enable to Power Active
0
0
0
ns
11
tEHICCLf
tPS
Chip Disable to Power Standby
25
35
45
ns
DATA VALID
5
tAXQX
3
tAVQV
DQ (DATA OUT)
ADDRESS
2
tAVAV
6
tELQX
STANDBY
DATA VALID
8
tGLQX
4
tGLQV
DQ (DATA OUT)
E
ADDRESS
2
tAVAV
G
ICC
ACTIVE
1
tELQV
10
tELICCH
11
tEHICCL
7
tEHQZ
9
tGHQZ