データシートサーチシステム |
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GS8150V18AGB-300 データシート(PDF) 10 Page - GSI Technology |
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GS8150V18AGB-300 データシート(HTML) 10 Page - GSI Technology |
10 / 25 page GS8150V18/36AB-357/333/300/250 Product Preview Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Rev: 1.04 4/2005 10/25 © 2003, GSI Technology 20% tKC VSS – 1.0 V 50% VSS VIH Undershoot Measurement and Timing Overshoot Measurement and Timing 20% tKC VDD + 1.0 V 50% VDD VIL Capacitance oC, f = 1 MHZ, VDD Parameter Symbol Test conditions Max. Unit Input Capacitance CIN VIN = 0 V 4 pF Output Capacitance COUT VOUT = 0 V 5 pF Output Capacitance (Clock) CIN(CK) VIN = 0 V 5 pF Note: This parameter is sample tested. AC Test Conditions Parameter Conditions Input high level 1.25 V Input low level 0.25 V Input rise/fall time (10% to 90%) 0.5 ns/0.5 ns Input reference level VDDQ/2 Clock input reference level Differential cross point Output reference level VDDQ/2 Clock (VDIF) 0.75 V Clock (VCM) 0.75 V VDDQ 1.5 V RQ 250 Ω (TA = 25 = 1.8 V) |
同様の部品番号 - GS8150V18AGB-300 |
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同様の説明 - GS8150V18AGB-300 |
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