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74F1245 データシート(PDF) 4 Page - NXP Semiconductors |
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74F1245 データシート(HTML) 4 Page - NXP Semiconductors |
4 / 10 page Philips Semiconductors Product specification 74F1245 Octal transceiver (3-State) 1995 Mar 01 4 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IO High level output current A0–A7 –3 mA IOH High-level output current B0–B7 –15 mA IO Low level output current A0–A7 24 mA IOL Low-level output current B0–B7 64 mA Tamb Operating free-air temperature range 0 70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) NO TAG LIMITS SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX UNIT A0–A7 B0–B7 IOH = –3mA ±10% VCC 2.4 V VOH High-level output voltage A0–A7, B0–B7 VCC = MIN, VIL = MAX IOH = –3mA ±5% VCC 2.7 3.3 V VOH High-level out ut voltage B0–B7 VIL = MAX, VIH = MIN IOH = –15mA ±10% VCC 2.0 V B0–B7 IOH = –15mA ±5% VCC 2.0 V A0–A7 IOL = 24mA ±10% VCC 0.35 0.50 V VOL Low-level output voltage A0–A7 VCC = MIN, VIL = MAX IOL = 24mA ±5% VCC 0.35 0.50 V VOL Low-level out ut voltage B0–B7 VIL = MAX, VIH = MIN IOL = 48mA ±10% VCC 0.30 0.55 V B0–B7 IOL = 64mA ±5% VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum OE, T/R VCC = 0.0V, VI = 7.0V 100 µA II input voltage A0–A7, B0–B7 VCC = 0.0V, VI = 5.5V 100 µA IIH High-level input current OE, T/R only VCC = MAX, VI = 2.7V 40 µA IIL Low-level input current OE, T/R only VCC = MAX, VI = 0.5V –20 µA IIH+IOZH Off-state output current High-level voltage applied VCC = MAX, VO = 2.7V 70 µA IIL+IOZL Off-state output current Low-level voltage applied VCC = MAX, VO = 0.5V –70 µA IOS Short-circuit output NO TAG A0–A7 VCC = MAX –60 –150 mA IOS currentNO TAG B0–B7 VCC = MAX –100 –225 mA ICCH 120 155 mA ICC Supply current (total) ICCL VCC = MAX 116 150 mA ICCZ 110 165 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
同様の部品番号 - 74F1245 |
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同様の説明 - 74F1245 |
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