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74F381 データシート(PDF) 6 Page - NXP Semiconductors

部品番号 74F381
部品情報  Arithmetic Logic Unit
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メーカー  PHILIPS [NXP Semiconductors]
ホームページ  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F381 データシート(HTML) 6 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F381
Arithmetic Logic Unit
1989 Mar 01
6
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARMETER
LIMITS
UNIT
SYMBOL
SYMBOL
PARMETER
MIN
NOM
MAX
UNIT
VCC
Supply voltage
4.5
5.0
5.5
V
VIH
High-level input voltage
2.0
V
VIL
Low-level input voltage
0.8
V
IIK
Input clamp current
–18
mA
IOH
High-level output current
–1
mA
IOL
Low-level output current
20
mA
Tamb
Operating free-air temperature range
0
70
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS1
MIN
TYP2
MAX
VOH
High-level output voltage
VCC = MIN, VIL = MAX,
±10%VCC
2.5
V
VOH
High-level output voltage
VIH = MIN, IOH = MAX
±5%VCC
2.7
3.4
V
VOL
Low-level output voltage
VCC = MIN, VIL = MAX,
±10%VCC
0.30
0.50
V
VOL
Low-level output voltage
VIH = MIN, IOL = MAX
±5%VCC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
An, Bn, Cn
VCC = MAX, VI = 0.5V
–2.4
mA
IIL
Low-level input current
S0, S1, S2
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
VCC = MAX
59
89
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.


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